Publication type: Article in scientific journal
Type of review: Peer review (publication)
Title: Electron emission mechanism for impact of CN- and SiN- clusters
Authors: St. John, Pamela M.
Yeretzian, Chahan
Whetten, Robert L.
DOI: 10.1021/j100202a005
Published in: The Journal of Physical Chemistry
Volume(Issue): 96
Issue: 23
Pages: 9100
Pages to: 9104
Issue Date: Nov-1992
Publisher / Ed. Institution: American Chemical Society
Publisher / Ed. Institution: Washington
ISSN: 0022-3654
Language: English
Subjects: Surface collisions; Fullerenes
Subject (DDC): 540: Chemistry
Abstract: Surface collisions of negatively charged atomic clusters CN- and SiN-, N < 15, have been investigated by timcof-flight methods. At low impact velocities ( < 10 km/s), the intact scattered ion and its charged fragments are clearly observed, along with ejected electrons.
Fulltext version: Published version
License (according to publishing contract): Licence according to publishing contract
Departement: Life Sciences and Facility Management
Organisational Unit: Institute of Chemistry and Biotechnology (ICBT)
Appears in Collections:Publikationen Life Sciences und Facility Management

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