Title: Electron emission mechanism for impact of CN- and SiN- clusters
Authors : St. John, Pamela M.
Yeretzian, Chahan
Whetten, Robert L.
Published in : The journal of physical chemistry
Volume(Issue) : 96
Issue : 23
Pages : 9100
Pages to: 9104
Publisher / Ed. Institution : American Chemical Society
Publisher / Ed. Institution: Washington
Issue Date: Nov-1992
License (according to publishing contract) : Licence according to publishing contract
Type of review: Peer review (Publication)
Language : English
Subjects : Surface collisions; Fullerenes
Subject (DDC) : 540: Chemistry
Abstract: Surface collisions of negatively charged atomic clusters CN- and SiN-, N < 15, have been investigated by timcof-flight methods. At low impact velocities ( < 10 km/s), the intact scattered ion and its charged fragments are clearly observed, along with ejected electrons.
Departement: Life Sciences und Facility Management
Organisational Unit: Institute of Chemistry and Biotechnology (ICBT)
Publication type: Article in scientific Journal
DOI : 10.1021/j100202a005
ISSN: 1089-5639
URI: https://digitalcollection.zhaw.ch/handle/11475/5442
Appears in Collections:Publikationen Life Sciences und Facility Management

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