| Publication type: | Article in scientific journal |
| Type of review: | Peer review (publication) |
| Title: | Electron emission mechanism for impact of CN- and SiN- clusters |
| Authors: | St. John, Pamela M. Yeretzian, Chahan Whetten, Robert L. |
| DOI: | 10.1021/j100202a005 |
| Published in: | The Journal of Physical Chemistry |
| Volume(Issue): | 96 |
| Issue: | 23 |
| Page(s): | 9100 |
| Pages to: | 9104 |
| Issue Date: | Nov-1992 |
| Publisher / Ed. Institution: | American Chemical Society |
| Publisher / Ed. Institution: | Washington |
| ISSN: | 0022-3654 1541-5740 |
| Language: | English |
| Subjects: | Surface collisions; Fullerenes |
| Subject (DDC): | 540: Chemistry |
| Abstract: | Surface collisions of negatively charged atomic clusters CN- and SiN-, N < 15, have been investigated by timcof-flight methods. At low impact velocities ( < 10 km/s), the intact scattered ion and its charged fragments are clearly observed, along with ejected electrons. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/5442 |
| Fulltext version: | Published version |
| License (according to publishing contract): | Licence according to publishing contract |
| Departement: | Life Sciences and Facility Management |
| Organisational Unit: | Institute of Chemistry and Biotechnology (ICBT) |
| Appears in collections: | Publikationen Life Sciences und Facility Management |
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St. John, P. M., Yeretzian, C., & Whetten, R. L. (1992). Electron emission mechanism for impact of CN- and SiN- clusters. The Journal of Physical Chemistry, 96(23), 9100–9104. https://doi.org/10.1021/j100202a005
St. John, P.M., Yeretzian, C. and Whetten, R.L. (1992) ‘Electron emission mechanism for impact of CN- and SiN- clusters’, The Journal of Physical Chemistry, 96(23), pp. 9100–9104. Available at: https://doi.org/10.1021/j100202a005.
P. M. St. John, C. Yeretzian, and R. L. Whetten, “Electron emission mechanism for impact of CN- and SiN- clusters,” The Journal of Physical Chemistry, vol. 96, no. 23, pp. 9100–9104, Nov. 1992, doi: 10.1021/j100202a005.
ST. JOHN, Pamela M., Chahan YERETZIAN und Robert L. WHETTEN, 1992. Electron emission mechanism for impact of CN- and SiN- clusters. The Journal of Physical Chemistry. November 1992. Bd. 96, Nr. 23, S. 9100–9104. DOI 10.1021/j100202a005
St. John, Pamela M., Chahan Yeretzian, and Robert L. Whetten. 1992. “Electron Emission Mechanism for Impact of CN- and SiN- Clusters.” The Journal of Physical Chemistry 96 (23): 9100–9104. https://doi.org/10.1021/j100202a005.
St. John, Pamela M., et al. “Electron Emission Mechanism for Impact of CN- and SiN- Clusters.” The Journal of Physical Chemistry, vol. 96, no. 23, Nov. 1992, pp. 9100–4, https://doi.org/10.1021/j100202a005.
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