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dc.contributor.authorSt. John, Pamela M.-
dc.contributor.authorYeretzian, Chahan-
dc.contributor.authorWhetten, Robert L.-
dc.date.accessioned2018-04-23T08:21:57Z-
dc.date.available2018-04-23T08:21:57Z-
dc.date.issued1992-11-
dc.identifier.issn0022-3654de_CH
dc.identifier.issn1541-5740de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/5442-
dc.description.abstractSurface collisions of negatively charged atomic clusters CN- and SiN-, N < 15, have been investigated by timcof-flight methods. At low impact velocities ( < 10 km/s), the intact scattered ion and its charged fragments are clearly observed, along with ejected electrons.de_CH
dc.language.isoende_CH
dc.publisherAmerican Chemical Societyde_CH
dc.relation.ispartofThe Journal of Physical Chemistryde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectSurface collisionsde_CH
dc.subjectFullerenesde_CH
dc.subject.ddc540: Chemiede_CH
dc.titleElectron emission mechanism for impact of CN- and SiN- clustersde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementLife Sciences und Facility Managementde_CH
zhaw.organisationalunitInstitut für Chemie und Biotechnologie (ICBT)de_CH
zhaw.publisher.placeWashingtonde_CH
dc.identifier.doi10.1021/j100202a005de_CH
zhaw.funding.euNode_CH
zhaw.issue23de_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end9104de_CH
zhaw.pages.start9100de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume96de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
Appears in collections:Publikationen Life Sciences und Facility Management

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St. John, P. M., Yeretzian, C., & Whetten, R. L. (1992). Electron emission mechanism for impact of CN- and SiN- clusters. The Journal of Physical Chemistry, 96(23), 9100–9104. https://doi.org/10.1021/j100202a005
St. John, P.M., Yeretzian, C. and Whetten, R.L. (1992) ‘Electron emission mechanism for impact of CN- and SiN- clusters’, The Journal of Physical Chemistry, 96(23), pp. 9100–9104. Available at: https://doi.org/10.1021/j100202a005.
P. M. St. John, C. Yeretzian, and R. L. Whetten, “Electron emission mechanism for impact of CN- and SiN- clusters,” The Journal of Physical Chemistry, vol. 96, no. 23, pp. 9100–9104, Nov. 1992, doi: 10.1021/j100202a005.
ST. JOHN, Pamela M., Chahan YERETZIAN und Robert L. WHETTEN, 1992. Electron emission mechanism for impact of CN- and SiN- clusters. The Journal of Physical Chemistry. November 1992. Bd. 96, Nr. 23, S. 9100–9104. DOI 10.1021/j100202a005
St. John, Pamela M., Chahan Yeretzian, and Robert L. Whetten. 1992. “Electron Emission Mechanism for Impact of CN- and SiN- Clusters.” The Journal of Physical Chemistry 96 (23): 9100–9104. https://doi.org/10.1021/j100202a005.
St. John, Pamela M., et al. “Electron Emission Mechanism for Impact of CN- and SiN- Clusters.” The Journal of Physical Chemistry, vol. 96, no. 23, Nov. 1992, pp. 9100–4, https://doi.org/10.1021/j100202a005.


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