Publication type: Conference other
Type of review: Peer review (abstract)
Title: Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms
Authors: Regnat, M.
Jenatsch, S.
Züfle, S.
Pernstich, K. P.
Ruhstaller, B.
et. al: No
Conference details: 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021
Issue Date: Aug-2021
Language: English
Subject (DDC): 621.3: Electrical, communications, control engineering
URI: https://digitalcollection.zhaw.ch/handle/11475/24654
Fulltext version: Submitted version
License (according to publishing contract): Not specified
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Appears in collections:Publikationen School of Engineering

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