| Publikationstyp: | Konferenz: Sonstiges |
| Art der Begutachtung: | Peer review (Abstract) |
| Titel: | Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms |
| Autor/-in: | Regnat, M. Jenatsch, S. Züfle, S. Pernstich, K. P. Ruhstaller, B. |
| et. al: | No |
| Angaben zur Konferenz: | 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021 |
| Erscheinungsdatum: | Aug-2021 |
| Sprache: | Englisch |
| Fachgebiet (DDC): | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/24654 |
| Volltext Version: | Eingereichte Version |
| Lizenz (gemäss Verlagsvertrag): | Keine Angabe |
| Departement: | School of Engineering |
| Organisationseinheit: | Institute of Computational Physics (ICP) |
| Enthalten in den Sammlungen: | Publikationen School of Engineering |
Dateien zu dieser Ressource:
Es gibt keine Dateien zu dieser Ressource.
Zur Langanzeige
Regnat, M., Jenatsch, S., Züfle, S., Pernstich, K. P., & Ruhstaller, B. (2021, August). Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M. et al. (2021) ‘Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms’, in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
M. Regnat, S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller, “Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms,” in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, Aug. 2021.
REGNAT, M., S. JENATSCH, S. ZÜFLE, K. P. PERNSTICH und B. RUHSTALLER, 2021. Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. In: 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021. Conference presentation. August 2021
Regnat, M., S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller. 2021. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” Conference presentation. In 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M., et al. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, 2021.
Alle Ressourcen in diesem Repository sind urheberrechtlich geschützt, soweit nicht anderweitig angezeigt.