| Publication type: | Conference other |
| Type of review: | Peer review (abstract) |
| Title: | Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms |
| Authors: | Regnat, M. Jenatsch, S. Züfle, S. Pernstich, K. P. Ruhstaller, B. |
| et. al: | No |
| Conference details: | 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021 |
| Issue Date: | Aug-2021 |
| Language: | English |
| Subject (DDC): | 621.3: Electrical, communications, control engineering |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/24654 |
| Fulltext version: | Submitted version |
| License (according to publishing contract): | Not specified |
| Departement: | School of Engineering |
| Organisational Unit: | Institute of Computational Physics (ICP) |
| Appears in collections: | Publikationen School of Engineering |
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Regnat, M., Jenatsch, S., Züfle, S., Pernstich, K. P., & Ruhstaller, B. (2021, August). Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M. et al. (2021) ‘Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms’, in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
M. Regnat, S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller, “Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms,” in 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, Aug. 2021.
REGNAT, M., S. JENATSCH, S. ZÜFLE, K. P. PERNSTICH und B. RUHSTALLER, 2021. Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms. In: 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021. Conference presentation. August 2021
Regnat, M., S. Jenatsch, S. Züfle, K. P. Pernstich, and B. Ruhstaller. 2021. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” Conference presentation. In 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021.
Regnat, M., et al. “Advanced Characterization and Device Simulation towards Better Understanding of OLED Degradation Mechanisms.” 21st International Meeting on Information Display (IMID 2021), Seoul, Korea, 25-27 August 2021, 2021.
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