Publikationstyp: Beitrag in wissenschaftlicher Zeitschrift
Art der Begutachtung: Peer review (Publikation)
Titel: Extended light scattering model incorporating coherence for thin-film silicon solar cells
Autor/-in: Lanz, Thomas
Ruhstaller, Beat
Battaglia, Corsin
Ballif, Christophe
DOI: 10.1063/1.3622328
Erschienen in: Journal of Applied Physics
Band(Heft): 110
Heft: 3
Erscheinungsdatum: 12-Aug-2011
Verlag / Hrsg. Institution: American Institute of Physics
ISSN: 0021-8979
1089-7550
Sprache: Englisch
Fachgebiet (DDC): 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik
Zusammenfassung: We present a comprehensive scalar light-scattering model for the optical simulation of silicon thin film solar cells. The model integrates coherent light propagation in thin layers with a direct, non-iterative treatment of light scattered at rough layer interfaces. The direct solution approach ensures computational efficiency, which is a key advantage for extensive calculations in the context of evaluation of different cell designs and parameter extraction. We validate the model with experimental external quantum efficiency spectra of state-of-the-art microcrystalline silicon solar cells. The simulations agree very well with measurements for cells deposited on both rough and flat substrates. The model is then applied to study the influence of the absorber layer thickness on the maximum achievable photocurrent for the two cell types. This efficient numerical framework will enable a quantitative model-based assessment of the optimization potential for light trapping in textured thin film silicon solar cells.
URI: https://digitalcollection.zhaw.ch/handle/11475/6970
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: School of Engineering
Organisationseinheit: Institute of Computational Physics (ICP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Lanz, T., Ruhstaller, B., Battaglia, C., & Ballif, C. (2011). Extended light scattering model incorporating coherence for thin-film silicon solar cells. Journal of Applied Physics, 110(3). https://doi.org/10.1063/1.3622328
Lanz, T. et al. (2011) ‘Extended light scattering model incorporating coherence for thin-film silicon solar cells’, Journal of Applied Physics, 110(3). Available at: https://doi.org/10.1063/1.3622328.
T. Lanz, B. Ruhstaller, C. Battaglia, and C. Ballif, “Extended light scattering model incorporating coherence for thin-film silicon solar cells,” Journal of Applied Physics, vol. 110, no. 3, Aug. 2011, doi: 10.1063/1.3622328.
LANZ, Thomas, Beat RUHSTALLER, Corsin BATTAGLIA und Christophe BALLIF, 2011. Extended light scattering model incorporating coherence for thin-film silicon solar cells. Journal of Applied Physics. 12 August 2011. Bd. 110, Nr. 3. DOI 10.1063/1.3622328
Lanz, Thomas, Beat Ruhstaller, Corsin Battaglia, and Christophe Ballif. 2011. “Extended Light Scattering Model Incorporating Coherence for Thin-Film Silicon Solar Cells.” Journal of Applied Physics 110 (3). https://doi.org/10.1063/1.3622328.
Lanz, Thomas, et al. “Extended Light Scattering Model Incorporating Coherence for Thin-Film Silicon Solar Cells.” Journal of Applied Physics, vol. 110, no. 3, Aug. 2011, https://doi.org/10.1063/1.3622328.


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