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dc.contributor.authorLanz, Thomas-
dc.contributor.authorRuhstaller, Beat-
dc.contributor.authorBattaglia, Corsin-
dc.contributor.authorBallif, Christophe-
dc.date.accessioned2018-06-15T14:23:42Z-
dc.date.available2018-06-15T14:23:42Z-
dc.date.issued2011-08-12-
dc.identifier.issn0021-8979de_CH
dc.identifier.issn1089-7550de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/6970-
dc.description.abstractWe present a comprehensive scalar light-scattering model for the optical simulation of silicon thin film solar cells. The model integrates coherent light propagation in thin layers with a direct, non-iterative treatment of light scattered at rough layer interfaces. The direct solution approach ensures computational efficiency, which is a key advantage for extensive calculations in the context of evaluation of different cell designs and parameter extraction. We validate the model with experimental external quantum efficiency spectra of state-of-the-art microcrystalline silicon solar cells. The simulations agree very well with measurements for cells deposited on both rough and flat substrates. The model is then applied to study the influence of the absorber layer thickness on the maximum achievable photocurrent for the two cell types. This efficient numerical framework will enable a quantitative model-based assessment of the optimization potential for light trapping in textured thin film silicon solar cells.de_CH
dc.language.isoende_CH
dc.publisherAmerican Institute of Physicsde_CH
dc.relation.ispartofJournal of Applied Physicsde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleExtended light scattering model incorporating coherence for thin-film silicon solar cellsde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1063/1.3622328de_CH
zhaw.funding.euNode_CH
zhaw.issue3de_CH
zhaw.originated.zhawYesde_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume110de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
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Lanz, T., Ruhstaller, B., Battaglia, C., & Ballif, C. (2011). Extended light scattering model incorporating coherence for thin-film silicon solar cells. Journal of Applied Physics, 110(3). https://doi.org/10.1063/1.3622328
Lanz, T. et al. (2011) ‘Extended light scattering model incorporating coherence for thin-film silicon solar cells’, Journal of Applied Physics, 110(3). Available at: https://doi.org/10.1063/1.3622328.
T. Lanz, B. Ruhstaller, C. Battaglia, and C. Ballif, “Extended light scattering model incorporating coherence for thin-film silicon solar cells,” Journal of Applied Physics, vol. 110, no. 3, Aug. 2011, doi: 10.1063/1.3622328.
LANZ, Thomas, Beat RUHSTALLER, Corsin BATTAGLIA und Christophe BALLIF, 2011. Extended light scattering model incorporating coherence for thin-film silicon solar cells. Journal of Applied Physics. 12 August 2011. Bd. 110, Nr. 3. DOI 10.1063/1.3622328
Lanz, Thomas, Beat Ruhstaller, Corsin Battaglia, and Christophe Ballif. 2011. “Extended Light Scattering Model Incorporating Coherence for Thin-Film Silicon Solar Cells.” Journal of Applied Physics 110 (3). https://doi.org/10.1063/1.3622328.
Lanz, Thomas, et al. “Extended Light Scattering Model Incorporating Coherence for Thin-Film Silicon Solar Cells.” Journal of Applied Physics, vol. 110, no. 3, Aug. 2011, https://doi.org/10.1063/1.3622328.


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