Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-1993
Title: Simulations, measurements and optimization of OLEDs with scattering layer
Authors : Altazin, Stéphane
Reynaud, Clément
Mayer, Ursula Maria
Lanz, Thomas
Lapagna, Kevin
Knaack, Reto
Penninck, Lieven
Kirsch, Christoph
Pernstich, Kurt P.
Harkema, Stephan
Hermes, Dorothee
Ruhstaller, Beat
Proceedings: SID international symposium : digest of technical papers
Volume(Issue) : 46
Pages : 564
Pages to: 567
Conference details: Society for Information display (SID) International Symposium, San Jose, May 21–June 5, 2015
Publisher / Ed. Institution : Wiley-Blackwell Publishing
Issue Date: 29-Jul-2015
License (according to publishing contract) : Licence according to publishing contract
Type of review: Peer review (Publication)
Language : English
Subjects : OLED; Light-scattering; Simulation; Mie particle
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: A multi-scale optical model for organic light-emitting devices containing scattering layers is presented. This model describes the radiation of embedded oscillating dipoles and scattering from spherical particles. After successful model validation with experiments on a top-emitting white OLED, we show how this tool can be used for optimization with specific targets.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Conference Paper
DOI : 10.1002/sdtp.10478
10.21256/zhaw-1993
ISSN: 0097-966X
URI: https://digitalcollection.zhaw.ch/handle/11475/6937
Appears in Collections:Publikationen School of Engineering

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