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Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-1993
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dc.contributor.authorAltazin, Stéphane-
dc.contributor.authorReynaud, Clément-
dc.contributor.authorMayer, Ursula Maria-
dc.contributor.authorLanz, Thomas-
dc.contributor.authorLapagna, Kevin-
dc.contributor.authorKnaack, Reto-
dc.contributor.authorPenninck, Lieven-
dc.contributor.authorKirsch, Christoph-
dc.contributor.authorPernstich, Kurt P.-
dc.contributor.authorHarkema, Stephan-
dc.contributor.authorHermes, Dorothee-
dc.contributor.authorRuhstaller, Beat-
dc.date.accessioned2018-06-15T11:57:15Z-
dc.date.available2018-06-15T11:57:15Z-
dc.date.issued2015-
dc.identifier.issn0097-966Xde_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/6937-
dc.description.abstractA multi-scale optical model for organic light-emitting devices containing scattering layers is presented. This model describes the radiation of embedded oscillating dipoles and scattering from spherical particles. After successful model validation with experiments on a top-emitting white OLED, we show how this tool can be used for optimization with specific targets.de_CH
dc.language.isoende_CH
dc.publisherWileyde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectOLEDde_CH
dc.subjectLight-scatteringde_CH
dc.subjectSimulationde_CH
dc.subjectMie particlede_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleSimulations, measurements and optimization of OLEDs with scattering layerde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1002/sdtp.10478de_CH
dc.identifier.doi10.21256/zhaw-1993-
zhaw.conference.detailsInternational Symposium of the Society for Information display (SID), San Jose, USA, 21 May - 5 June 2015de_CH
zhaw.funding.euinfo:eu-repo/grantAgreement/EC/FP7/295368//Integrated Multidisciplinary & Multiscale Modeling for Organic Light-Emitting Diodes/IM3OLEDde_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end567de_CH
zhaw.pages.start564de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume46de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
zhaw.title.proceedingsSID international symposium : digest of technical papersde_CH
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Altazin, S., Reynaud, C., Mayer, U. M., Lanz, T., Lapagna, K., Knaack, R., Penninck, L., Kirsch, C., Pernstich, K. P., Harkema, S., Hermes, D., & Ruhstaller, B. (2015). Simulations, measurements and optimization of OLEDs with scattering layer [Conference paper]. SID International Symposium : Digest of Technical Papers, 46, 564–567. https://doi.org/10.1002/sdtp.10478
Altazin, S. et al. (2015) ‘Simulations, measurements and optimization of OLEDs with scattering layer’, in SID international symposium : digest of technical papers. Wiley, pp. 564–567. Available at: https://doi.org/10.1002/sdtp.10478.
S. Altazin et al., “Simulations, measurements and optimization of OLEDs with scattering layer,” in SID international symposium : digest of technical papers, 2015, vol. 46, pp. 564–567. doi: 10.1002/sdtp.10478.
ALTAZIN, Stéphane, Clément REYNAUD, Ursula Maria MAYER, Thomas LANZ, Kevin LAPAGNA, Reto KNAACK, Lieven PENNINCK, Christoph KIRSCH, Kurt P. PERNSTICH, Stephan HARKEMA, Dorothee HERMES und Beat RUHSTALLER, 2015. Simulations, measurements and optimization of OLEDs with scattering layer. In: SID international symposium : digest of technical papers. Conference paper. Wiley. 2015. S. 564–567
Altazin, Stéphane, Clément Reynaud, Ursula Maria Mayer, Thomas Lanz, Kevin Lapagna, Reto Knaack, Lieven Penninck, et al. 2015. “Simulations, Measurements and Optimization of OLEDs with Scattering Layer.” Conference paper. In SID International Symposium : Digest of Technical Papers, 46:564–67. Wiley. https://doi.org/10.1002/sdtp.10478.
Altazin, Stéphane, et al. “Simulations, Measurements and Optimization of OLEDs with Scattering Layer.” SID International Symposium : Digest of Technical Papers, vol. 46, Wiley, 2015, pp. 564–67, https://doi.org/10.1002/sdtp.10478.


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