Modelling crosstalk through common semiconductor layers in AMOLED displays

Penninck, Lieven; Diethelm, Matthias; Altazin, Stéphane; Hiestand, Roman; Kirsch, Christoph; Ruhstaller, Beat

doi:10.1002/jsid.671

Publication type:	Article in scientific journal
Type of review:	Not specified
Title:	Modelling crosstalk through common semiconductor layers in AMOLED displays
Authors:	Penninck, Lieven Diethelm, Matthias Altazin, Stéphane Hiestand, Roman Kirsch, Christoph Ruhstaller, Beat
DOI:	10.1002/jsid.671
Published in:	Journal of the Society for Information Display
Volume(Issue):	26
Issue:	9
Page(s):	546
Pages to:	554
Issue Date:	2018
Publisher / Ed. Institution:	Wiley
ISSN:	1071-0922 1938-3657
Language:	English
Subjects:	OLED; Crosstalk
Subject (DDC):
Abstract:	High pixel density displays are demanded for active matrix organic light‐emitting diode displays (AMOLED) in applications such as virtual reality headsets, micro‐displays, and high‐end smartphones. Parasitic emission from non‐addressed neighboring pixels (crosstalk) is a common problem in such high pixel density AMOLED, and this crosstalk becomes more severe as the pixel density and fill ratio of the display increases. One of the causes of crosstalk is parasitic currents that travel through common organic semiconductor layers. In this paper, we model and quantify the pixel crosstalk using a 2 + 1D finite element model that is based on the conductivity of the common layer and the luminance-current-voltage curves of the subpixels as measured input parameters. We assess the effect of crosstalk on the pixel current, observed color, and luminance. The 2 + 1D model limits the number of degrees of freedom so that calculations on a standard personal computer are feasible.
URI:	https://digitalcollection.zhaw.ch/handle/11475/15781
Fulltext version:	Published version
License (according to publishing contract):	Licence according to publishing contract
Departement:	School of Engineering
Organisational Unit:	Institute of Computational Physics (ICP)
Appears in collections:	Publikationen School of Engineering

Files in This Item:

There are no files associated with this item.

Show full item record

Penninck, L., Diethelm, M., Altazin, S., Hiestand, R., Kirsch, C., & Ruhstaller, B. (2018). Modelling crosstalk through common semiconductor layers in AMOLED displays. Journal of the Society for Information Display, 26(9), 546–554. https://doi.org/10.1002/jsid.671

Penninck, L. et al. (2018) ‘Modelling crosstalk through common semiconductor layers in AMOLED displays’, Journal of the Society for Information Display, 26(9), pp. 546–554. Available at: https://doi.org/10.1002/jsid.671.

L. Penninck, M. Diethelm, S. Altazin, R. Hiestand, C. Kirsch, and B. Ruhstaller, “Modelling crosstalk through common semiconductor layers in AMOLED displays,” Journal of the Society for Information Display, vol. 26, no. 9, pp. 546–554, 2018, doi: 10.1002/jsid.671.

PENNINCK, Lieven, Matthias DIETHELM, Stéphane ALTAZIN, Roman HIESTAND, Christoph KIRSCH und Beat RUHSTALLER, 2018. Modelling crosstalk through common semiconductor layers in AMOLED displays. Journal of the Society for Information Display. 2018. Bd. 26, Nr. 9, S. 546–554. DOI 10.1002/jsid.671

Penninck, Lieven, Matthias Diethelm, Stéphane Altazin, Roman Hiestand, Christoph Kirsch, and Beat Ruhstaller. 2018. “Modelling Crosstalk through Common Semiconductor Layers in AMOLED Displays.” Journal of the Society for Information Display 26 (9): 546–54. https://doi.org/10.1002/jsid.671.

Penninck, Lieven, et al. “Modelling Crosstalk through Common Semiconductor Layers in AMOLED Displays.” Journal of the Society for Information Display, vol. 26, no. 9, 2018, pp. 546–54, https://doi.org/10.1002/jsid.671.