Title: Modelling crosstalk through common semiconductor layers in AMOLED displays
Authors : Penninck, Lieven
Diethelm, Matthias
Altazin, Stéphane
Hiestand, Roman
Kirsch, Christoph
Ruhstaller, Beat
Published in : Journal of the Society for Information Display
Volume(Issue) : 26
Issue : 9
Pages : 546
Pages to: 554
Publisher / Ed. Institution : Wiley
Issue Date: 2018
License (according to publishing contract) : Licence according to publishing contract
Type of review: Not specified
Language : English
Subjects : OLED; Crosstalk
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: High pixel density displays are demanded for active matrix organic light‐emitting diode displays (AMOLED) in applications such as virtual reality headsets, micro‐displays, and high‐end smartphones. Parasitic emission from non‐addressed neighboring pixels (crosstalk) is a common problem in such high pixel density AMOLED, and this crosstalk becomes more severe as the pixel density and fill ratio of the display increases. One of the causes of crosstalk is parasitic currents that travel through common organic semiconductor layers. In this paper, we model and quantify the pixel crosstalk using a 2 + 1D finite element model that is based on the conductivity of the common layer and the luminance–current–voltage curves of the subpixels as measured input parameters. We assess the effect of crosstalk on the pixel current, observed color, and luminance. The 2 + 1D model limits the number of degrees of freedom so that calculations on a standard personal computer are feasible.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Article in scientific Journal
DOI : 10.1002/jsid.671
ISSN: 1071-0922
1938-3657
URI: https://digitalcollection.zhaw.ch/handle/11475/15781
Appears in Collections:Publikationen School of Engineering

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