Title: Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes
Authors : Leger, J. M.
Carter, S. A.
Ruhstaller, Beat
Nothofer, H.-G.
Scherf, Ullrich
Tillmann, H.
Hörhold, H.-H.
Published in : Physical Review B
Volume(Issue) : 68
Issue : 5
Publisher / Ed. Institution : American Physical Society
Issue Date: 26-Aug-2003
License (according to publishing contract) : Licence according to publishing contract
Type of review: Peer review (Publication)
Language : English
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: We explore the thickness-dependent optical properties of single layer polymer light emitting diodes for two materials, poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene-ethenylene-2,5-dioctyloxy-1,4phenylene-ethen ylene] (MEH-DOO-PPV) and poly(2,7-(9,9-bis(2-ethylhexyl))fluorene)-2,7-bis(4-methylphenyl)phenylamine (PF with 2% endcap). We compare experimental electroluminescence spectra and radiance values as a function of emissive layer thickness with simulations utilizing dipole methods within a transfer-matrix formalism. The technique is then extended to explore how simulated results depend on the assumed location of emission within the polymer layer. We show that thickness-dependent optical properties of these devices are dominated by interference effects.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Article in scientific Journal
DOI : 10.1103/PhysRevB.68.054209
ISSN: 2469-9950
URI: https://digitalcollection.zhaw.ch/handle/11475/6958
Appears in Collections:Publikationen School of Engineering

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