Issue Date | Title | Involved Person(s) |
1-Feb-2011 | Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheres | Holzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel; Wiedenmann, Daniel; Vogt, Uli; Holtappels, Peter; Sfeir, Josef; Mai, Andreas; Graule, Thomas |
2011 | Numerical impedance analysis for organic semiconductors with exponential distribution of localized states | Knapp, Evelyne; Ruhstaller, Beat |
1-Oct-2010 | Simulation and validation of thermo-mechanical stresses in planar SOFCs | Kuebler, Jakob; Vogt, Uli F.; Haberstock, D.; Sfeir, J.; Mai, Andreas; Hocker, Thomas; Roos, Markus; Harnisch, Urs |