Title: Simulation and validation of thermo-mechanical stresses in planar SOFCs
Authors : Kuebler, Jakob
Vogt, Uli F.
Haberstock, D.
Sfeir, J.
Mai, Andreas
Hocker, Thomas
Roos, Markus
Harnisch, Urs
Published in : Fuel Cells
Volume(Issue) : 10
Issue : 6
Pages : 1066
Pages to: 1073
Publisher / Ed. Institution : Wiley - VCH Verlag GmbH & Co. KGaA
Issue Date: 1-Oct-2010
Language : Englisch / English
Subjects : Fuel cell; Thermo-mechanical stress; Failure mechanism; SOFC
Subject (DDC) : 530: Physik
621.3: Elektrotechnik, Elektronik
Abstract: To study possible failure modes of the Hexis Galileo solid oxide fuel cell stack, various stack components such as nickel/yttria stabilised zirconia anodes, lanthanum strontium manganese cathodes, 3 mol%-yttria stabilised zirconia electrolytes and chromium alloy metallic interconnectors have been characterised with respect to their thermo-mechanical properties. Specifically, coefficients of thermal expansion, Young's moduli, bending strengths, Poisson's ratios and fracture toughnesses have been measured. Furthermore, the temperature-dependent warpage of complete cells has been investigated by video analysis. All experimental data were taken as input parameters for a set of finite element models to analyse various thermo-mechanical phenomena on different length scales. The simulations offer an explanation for the often observed ´saddle-like´ deformations of cells at room temperature. They also show that cracks that first develop within the anode induce local tensile stresses within the electrolyte and hence represent a weakening mechanism for the cells. It is shown that the induced electrolyte stresses depend on the anode crack density. The electrolyte stresses decrease as the distances between the anode cracks become smaller.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Beitrag in wissenschaftlicher Zeitschrift / Article in scientific Journal
DOI : 10.1002/fuce.201000040
ISSN: 1615-6854
URI: https://digitalcollection.zhaw.ch/handle/11475/1638
Appears in Collections:Publikationen School of Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.