Publication type: Article in scientific journal
Type of review: Peer review (publication)
Title: Delayed emission of electrons from C60 following energetic impact against graphite
Authors: Yeretzian, Chahan
Whetten, Robert L.
DOI: 10.1007/BF01426705
Published in: Zeitschrift für Physik D: Atoms, Molecules and Clusters
Volume(Issue): 24
Issue: 2
Pages: 199
Pages to: 202
Issue Date: Jun-1992
Publisher / Ed. Institution: Springer
Publisher / Ed. Institution: Berlin
ISSN: 0178-7683
1431-5866
Language: English
Subjects: Surface collisions; Fullerenes; Electron emission
Subject (DDC): 530: Physics
Abstract: The yield of C60+ ions reflected from the surface of graphite is found to be a bimodal function of the energy of impact. Below 140 eV (6 km/s), the yield decreases with energy and the scattering time-of-flight peak is sharp. Above 170 eV, the yield increases, but the peak is broad and asymmetric, corresponding to delayed electron emission from an impact-heated, neutralized cluster. There is also evidence for fragmentation to C58 and C56. The emission process may be analogous to that reported for scattered C60-. Application of statistical rate theory to either observation (C60± ) gives an estimated 25-30 percent transfer of impact energy into cluster internal modes. The decreasing yield at highest energies (>400 eV) may result from adhesion processes (C60-surface bonding) that could also account for the absence of delayed electron emission in C60-silicon collisions.
URI: https://digitalcollection.zhaw.ch/handle/11475/5435
Fulltext version: Published version
License (according to publishing contract): Licence according to publishing contract
Departement: Life Sciences and Facility Management
Organisational Unit: Institute of Chemistry and Biotechnology (ICBT)
Appears in Collections:Publikationen Life Sciences und Facility Management

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