|Title:||Delayed emission of electrons from C60 following energetic impact against graphite|
|Authors :||Yeretzian, Chahan|
Whetten, Robert L.
|Published in :||Zeitschrift für Physik D Atoms, Molecules and Clusters|
|Publisher / Ed. Institution :||Springer|
|Publisher / Ed. Institution:||Berlin|
|License (according to publishing contract) :||Licence according to publishing contract|
|Type of review:||Not specified|
|Subjects :||Surface collisions; Fullerenes; Electron emission|
|Subject (DDC) :||530: Physics|
|Abstract:||The yield of C60+ ions reflected from the surface of graphite is found to be a bimodal function of the energy of impact. Below 140 eV (6 km/s), the yield decreases with energy and the scattering time-of-flight peak is sharp. Above 170 eV, the yield increases, but the peak is broad and asymmetric, corresponding to delayed electron emission from an impact-heated, neutralized cluster. There is also evidence for fragmentation to C58 and C56. The emission process may be analogous to that reported for scattered C60-. Application of statistical rate theory to either observation (C60± ) gives an estimated 25-30 percent transfer of impact energy into cluster internal modes. The decreasing yield at highest energies (>400 eV) may result from adhesion processes (C60-surface bonding) that could also account for the absence of delayed electron emission in C60-silicon collisions.|
|Departement:||Life Sciences und Facility Management|
|Organisational Unit:||Institute of Chemistry and Biotechnology (ICBT)|
|Publication type:||Article in scientific Journal|
|Appears in Collections:||Publikationen Life Sciences und Facility Management|
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