Title: Electrothermal finite-element modeling for defect characterization in thin-film silicon solar modules
Authors : Lanz, Thomas
Bonmarin, Mathias
Stuckelberger, Michael
Schlumpf, Christian
Ballif, Christophe
Ruhstaller, Beat
Published in : IEEE Journal of Selected Topics in Quantum Electronics
Volume(Issue) : 19
Issue : 5
Pages : 1
Pages to: 8
Publisher / Ed. Institution : IEEE
Issue Date: 2013
Language : Englisch / English
Subject (DDC) : 621.3: Elektrotechnik, Elektronik
Abstract: We present and validate a finite-element model for coupled charge and heat transport in monolithically interconnected thin-film solar modules. Using measured current-voltage ( I-V) and lock-in thermography (LIT) measurements of amorphous silicon minimodules, we experimentally validate our model. The entire module volume is represented by two planes (front and back electrodes) which are coupled in vertical direction using 1-D models, leading to a large reduction of the degrees of freedom in the numerical model and contributing to an efficient solution approach. As compared to 3-D models, the vertical coupling of the charge transport is represented by local temperature-dependent I-V curves. These can be obtained by drift-diffusion calculations, single-cell measurements or, as presented here, by an analytical solar cell diode model. Inhomogeneous heat sources such as Joule's heating in the electrodes lead to nonuniform temperature distributions. The explicit temperature dependence in the local I-V curve, therefore, mediates the feedback of the thermal transport on the local electrical cell characteristics. We employ measured I-V curves under partial illumination and analytical solutions for the potential distribution to validate this approach. Further, with LIT measurements of the same modules with and without artificially induced electrical shunts, we verify the computed temperature distributions.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Beitrag in wissenschaftlicher Zeitschrift / Article in scientific Journal
Type of review: Peer review (Publikation)
DOI : 10.1109/JSTQE.2013.2250259
ISSN: 1077-260X
1558-4542
URI: https://digitalcollection.zhaw.ch/handle/11475/5023
License (according to publishing contract) : Lizenz gemäss Verlagsvertrag / Licence according to publishing contract
Appears in Collections:Publikationen School of Engineering

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