Please use this identifier to cite or link to this item: https://doi.org/10.21256/zhaw-22214
Publication type: Article in scientific journal
Type of review: Peer review (publication)
Title: Long-term power degradation analysis of crystalline silicon PV modules using indoor and outdoor measurement techniques
Authors: Carigiet, Fabian
Brabec, Christoph J.
Baumgartner, Franz
et. al: No
DOI: 10.1016/j.rser.2021.111005
10.21256/zhaw-22214
Published in: Renewable and Sustainable Energy Reviews
Volume(Issue): 144
Issue: 111005
Issue Date: Jul-2021
Publisher / Ed. Institution: Elsevier
ISSN: 1364-0321
1879-0690
Language: English
Subjects: c-Si solar cell; Outdoor test field; Solar simulator measurement; Outdoor performance monitoring; Performance ratio; Degradation rate
Subject (DDC): 621.3: Electrical, communications, control engineering
Abstract: Annual degradation rates of PV modules are important in the yield prediction. For a high-quality PV module, these rates are lower than the measurement uncertainty of a nominal power measurement performed in todays most advanced certified photovoltaic reference laboratory. Therefore, the analysis requires a well thought out methodology that can compare the data relative to each other or relative to an unused module stored in the dark on an annual base. Over the past 10 years, several multi c-Si and HIT modules have been accurately monitored in a string and single module setup by an outdoor performance measurement system. Additionally, all modules have been dismantled and measured using an indoor flasher measurement system once every year. With this unique measurement setup, the annual degradation rates of multi c-Si modules and HIT modules are quantified based on three different analysis methodologies. The multi c-Si modules showed an average annual degradation rate of 0.18% ± 0.06% and 0.29% ± 0.06% measured by the outdoor and indoor system, respectively. The indoor analysis of the HIT modules yielded an average annual degradation of 0.26% ± 0.05%. That corresponds to half of the degradation observed by the outdoor analysis method. Further evaluations of the performance ratio PR confirmed the results gained by the indoor methodology. The comparison of the standard PR with a temperaturecorrected PR’STC for both technologies showed that the benefit of the lower temperature coefficient of the HIT technology is eliminated by its worse low light behaviour.
URI: https://digitalcollection.zhaw.ch/handle/11475/22214
Fulltext version: Published version
License (according to publishing contract): CC BY 4.0: Attribution 4.0 International
Departement: School of Engineering
Organisational Unit: Institute of Energy Systems and Fluid Engineering (IEFE)
Appears in collections:Publikationen School of Engineering

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