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  2. School of Engineering
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  4. Publikationen School of Engineering
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dc.contributor.authorNussbaumer, Hartmut-
dc.contributor.authorKlenk, Markus-
dc.contributor.authorMorf, Marco-
dc.contributor.authorMeister, Jan-
dc.contributor.authorWerner, Dieter-
dc.date.accessioned2021-01-21T14:31:05Z-
dc.date.available2021-01-21T14:31:05Z-
dc.date.issued2020-06-15-
dc.identifier.isbn978-1-7281-6115-0de_CH
dc.identifier.isbn978-1-7281-6116-7de_CH
dc.identifier.issn0160-8371de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/21392-
dc.description.abstractIn a previous work, we have shown that miniaturized test systems can be used to reproduce the energy yield of larger systems accurately. Accordingly, such miniaturized systems can be used to evaluate varying system concepts or to reveal differing properties in direct, comparative measurements. The smaller size enables a considerably increased flexibility and a fast realization compared to full sized test fields. Based on such measurements, optimized system configurations can be found or a yield prediction can be made. This is of interest for PV systems and technologies for which simulation tools with sufficient or validated accuracy are not available. Examples are bifacial modules, particularly with steep tilt angles or Perovskite cell types. In this paper, we report on a commercially available miniaturized model kit to reproduce measurements of PV systems. It is an improved version of the previously used test rig that allows a flexible arrangement of the modules to represent various types of PV systems.de_CH
dc.language.isoende_CH
dc.publisherIEEEde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectEnergy yieldde_CH
dc.subjectOptimizationde_CH
dc.subjectMeasurementde_CH
dc.subjectModel kitde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleMiniaturized model kit for yield measurements of PV systems : concept and applicationde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitut für Energiesysteme und Fluid-Engineering (IEFE)de_CH
dc.identifier.doi10.1109/PVSC45281.2020.9300554de_CH
zhaw.conference.details2020 47th IEEE Photovoltaic Specialists Conference (PVSC), Calgary (Canada), 15 June 2020de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end1095de_CH
zhaw.pages.start1093de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
zhaw.title.proceedingsProceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)de_CH
zhaw.webfeedPhotovoltaikde_CH
zhaw.author.additionalNode_CH
zhaw.display.portraitYesde_CH
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Nussbaumer, H., Klenk, M., Morf, M., Meister, J., & Werner, D. (2020). Miniaturized model kit for yield measurements of PV systems : concept and application [Conference paper]. Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 1093–1095. https://doi.org/10.1109/PVSC45281.2020.9300554
Nussbaumer, H. et al. (2020) ‘Miniaturized model kit for yield measurements of PV systems : concept and application’, in Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, pp. 1093–1095. Available at: https://doi.org/10.1109/PVSC45281.2020.9300554.
H. Nussbaumer, M. Klenk, M. Morf, J. Meister, and D. Werner, “Miniaturized model kit for yield measurements of PV systems : concept and application,” in Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), Jun. 2020, pp. 1093–1095. doi: 10.1109/PVSC45281.2020.9300554.
NUSSBAUMER, Hartmut, Markus KLENK, Marco MORF, Jan MEISTER und Dieter WERNER, 2020. Miniaturized model kit for yield measurements of PV systems : concept and application. In: Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC). Conference paper. IEEE. 15 Juni 2020. S. 1093–1095. ISBN 978-1-7281-6115-0
Nussbaumer, Hartmut, Markus Klenk, Marco Morf, Jan Meister, and Dieter Werner. 2020. “Miniaturized Model Kit for Yield Measurements of PV Systems : Concept and Application.” Conference paper. In Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 1093–95. IEEE. https://doi.org/10.1109/PVSC45281.2020.9300554.
Nussbaumer, Hartmut, et al. “Miniaturized Model Kit for Yield Measurements of PV Systems : Concept and Application.” Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 1093–95, https://doi.org/10.1109/PVSC45281.2020.9300554.


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