| Publikationstyp: | Konferenz: Paper |
| Art der Begutachtung: | Peer review (Publikation) |
| Titel: | Miniaturized model kit for yield measurements of PV systems : concept and application |
| Autor/-in: | Nussbaumer, Hartmut Klenk, Markus Morf, Marco Meister, Jan Werner, Dieter |
| et. al: | No |
| DOI: | 10.1109/PVSC45281.2020.9300554 |
| Tagungsband: | Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) |
| Seite(n): | 1093 |
| Seiten bis: | 1095 |
| Angaben zur Konferenz: | 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), Calgary (Canada), 15 June 2020 |
| Erscheinungsdatum: | 15-Jun-2020 |
| Verlag / Hrsg. Institution: | IEEE |
| ISBN: | 978-1-7281-6115-0 978-1-7281-6116-7 |
| ISSN: | 0160-8371 |
| Sprache: | Englisch |
| Schlagwörter: | Energy yield; Optimization; Measurement; Model kit |
| Fachgebiet (DDC): | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik |
| Zusammenfassung: | In a previous work, we have shown that miniaturized test systems can be used to reproduce the energy yield of larger systems accurately. Accordingly, such miniaturized systems can be used to evaluate varying system concepts or to reveal differing properties in direct, comparative measurements. The smaller size enables a considerably increased flexibility and a fast realization compared to full sized test fields. Based on such measurements, optimized system configurations can be found or a yield prediction can be made. This is of interest for PV systems and technologies for which simulation tools with sufficient or validated accuracy are not available. Examples are bifacial modules, particularly with steep tilt angles or Perovskite cell types. In this paper, we report on a commercially available miniaturized model kit to reproduce measurements of PV systems. It is an improved version of the previously used test rig that allows a flexible arrangement of the modules to represent various types of PV systems. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/21392 |
| Volltext Version: | Publizierte Version |
| Lizenz (gemäss Verlagsvertrag): | Lizenz gemäss Verlagsvertrag |
| Departement: | School of Engineering |
| Organisationseinheit: | Institut für Energiesysteme und Fluid-Engineering (IEFE) |
| Enthalten in den Sammlungen: | Publikationen School of Engineering |
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Nussbaumer, H., Klenk, M., Morf, M., Meister, J., & Werner, D. (2020). Miniaturized model kit for yield measurements of PV systems : concept and application [Conference paper]. Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 1093–1095. https://doi.org/10.1109/PVSC45281.2020.9300554
Nussbaumer, H. et al. (2020) ‘Miniaturized model kit for yield measurements of PV systems : concept and application’, in Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, pp. 1093–1095. Available at: https://doi.org/10.1109/PVSC45281.2020.9300554.
H. Nussbaumer, M. Klenk, M. Morf, J. Meister, and D. Werner, “Miniaturized model kit for yield measurements of PV systems : concept and application,” in Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), Jun. 2020, pp. 1093–1095. doi: 10.1109/PVSC45281.2020.9300554.
NUSSBAUMER, Hartmut, Markus KLENK, Marco MORF, Jan MEISTER und Dieter WERNER, 2020. Miniaturized model kit for yield measurements of PV systems : concept and application. In: Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC). Conference paper. IEEE. 15 Juni 2020. S. 1093–1095. ISBN 978-1-7281-6115-0
Nussbaumer, Hartmut, Markus Klenk, Marco Morf, Jan Meister, and Dieter Werner. 2020. “Miniaturized Model Kit for Yield Measurements of PV Systems : Concept and Application.” Conference paper. In Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 1093–95. IEEE. https://doi.org/10.1109/PVSC45281.2020.9300554.
Nussbaumer, Hartmut, et al. “Miniaturized Model Kit for Yield Measurements of PV Systems : Concept and Application.” Proceedings of the 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 1093–95, https://doi.org/10.1109/PVSC45281.2020.9300554.
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