|Title:||Method and device for characterizing the linear properties of an electrical component|
|Inventor :||Niayesh, Kaveh|
|Patent submitter:||ABB Research Ltd|
|Subject (DDC) :||621.3: Electrical engineering and electronics|
|Abstract:||The invention relates to a method and a device for characterizing the linear properties of an electrical multiport component. It also relates to a method for modeling an electrical system with at least one component characterized in this manner.|
|Further description :||Also published as: BRPI0606482 (A2), CA2601321 (A1), CA2601321 (C), CN101107533 (A), CN101107533 (B), ES2638765 (T3), NO20074246 (L), RU2007131587 (A), RU2383027 (C2), US2007285109 (A1), US8154311, (B2), WO2006076824 (A1)|
|Departement:||School of Engineering|
|Organisational Unit:||Institute of Data Analysis and Process Design (IDP)|
|Appears in Collections:||Patente School of Engineering|
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