Title: Method and device for characterizing the linear properties of an electrical component
Inventor : Niayesh, Kaveh
Berth, Matthias
Dahlquist, Andreas
Tiberg, Martin
Heitz, Christoph
Patent submitter: ABB Research Ltd
Issue Date: 14-Jun-2017
Language : English
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: The invention relates to a method and a device for characterizing the linear properties of an electrical multiport component. It also relates to a method for modeling an electrical system with at least one component characterized in this manner.
Further description : Also published as: BRPI0606482 (A2), CA2601321 (A1), CA2601321 (C), CN101107533 (A), CN101107533 (B), ES2638765 (T3), NO20074246 (L), RU2007131587 (A), RU2383027 (C2), US2007285109 (A1), US8154311, (B2), WO2006076824 (A1)
Departement: School of Engineering
Organisational Unit: Institute of Data Analysis and Process Design (IDP)
Publication type: Patent
Patentnumber : EP1684081
metadata.zhaw.publication.code: B1
URI: https://register.epo.org/application?number=EP05405031
https://digitalcollection.zhaw.ch/handle/11475/17030
Appears in Collections:Patente School of Engineering

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