| Publikationstyp: | Patent |
| Titel: | Method and device for characterizing the linear properties of an electrical component |
| Erfinder/-in: | Niayesh, Kaveh Berth, Matthias Dahlquist, Andreas Tiberg, Martin Heitz, Christoph |
| Patentanmelder/-in: | ABB Research Ltd |
| Anmeldedatum: | 21-Jan-2005 |
| Erscheinungsdatum: | 14-Jun-2017 |
| Publikationsnummer: | EP1684081 |
| metadata.zhaw.publication.code: | B1 |
| Veröffentlicht als: | BRPI0606482A2; CA2601321A1; CA2601321C; CN101107533A; CN101107533B; ES2638765T3; NO20074246L; RU2007131587A; RU2383027C2; US2007285109A1; US8154311B2; WO2006076824A1 |
| Sprache: | Englisch |
| Fachgebiet (DDC): | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik |
| Zusammenfassung: | The invention relates to a method and a device for characterizing the linear properties of an electrical multiport component. It also relates to a method for modeling an electrical system with at least one component characterized in this manner. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/17030 https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1 |
| Departement: | School of Engineering |
| Organisationseinheit: | Institut für Datenanalyse und Prozessdesign (IDP) |
| Enthalten in den Sammlungen: | Patente School of Engineering |
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Niayesh, K., Berth, M., Dahlquist, A., Tiberg, M., & Heitz, C. (2017). Method and device for characterizing the linear properties of an electrical component (Patent No. EP1684081B1). https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, K. et al. (2017) ‘Method and device for characterizing the linear properties of an electrical component’. Available at: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
K. Niayesh, M. Berth, A. Dahlquist, M. Tiberg, and C. Heitz, “Method and device for characterizing the linear properties of an electrical component,” EP1684081B1, Jun. 14, 2017 [Online]. Available: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
NIAYESH, Kaveh, Matthias BERTH, Andreas DAHLQUIST, Martin TIBERG und Christoph HEITZ, 2017. Method and device for characterizing the linear properties of an electrical component [online]. EP1684081B1. 14 Juni 2017. Verfügbar unter: https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1
Niayesh, Kaveh, Matthias Berth, Andreas Dahlquist, Martin Tiberg, and Christoph Heitz. 2017. Method and device for characterizing the linear properties of an electrical component. EP1684081B1, filed January 21, 2005, and issued June 14, 2017. https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
Niayesh, Kaveh, et al. Method and Device for Characterizing the Linear Properties of an Electrical Component. EP1684081B1, 14 June 2017, https://worldwide.espacenet.com/patent/search?q=pn%3DEP1684081B1.
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