Title: Analysis of the low-energy π-p charge-exchange data
Authors : Matsinos, Evangelos
Rasche, G.
Published in : International journal of modern physics A
Volume(Issue) : 28
Issue : 12
Pages : 1350039
Publisher / Ed. Institution : World Scientific
Issue Date: 2013
License (according to publishing contract) : Licence according to publishing contract
Type of review: Peer review (publication)
Language : English
Subject (DDC) : 530: Physics
Abstract: We analyze the charge-exchange (CX) measurements π-p→π0n below pion laboratory kinetic energy of 100 MeV. After the removal of five degrees of freedom from the initial database, we combine it with the truncated π+p database [E. Matsinos and G. Rasche, J. Mod. Phys.3, 1369 (2012)] and fit the ETH model [P. F. A. Goudsmit, H. J. Leisi, E. Matsinos, B. L. Birbrair and A. B. Gridnev, Nucl. Phys. A575, 673 (1994)] to the resulting data. The set of the parameter values of the ETH model, as well as the predictions derived on their basis for the hadronic phase shifts and for the low-energy πN constants, are significantly different from the results obtained in the analysis of the truncated π±p elastic-scattering databases. The main difference in the hadronic phase shifts occurs in delta_0^{1/2}. We discuss the implications of these findings in terms of the violation of the isospin invariance in the hadronic part of the πN interaction. The effect observed amounts to the level of 7–8% in the CX scattering amplitude below 70 MeV. The results and conclusions of this study agree well with those obtained in the mid 1990s, when the isospin invariance was first tested by using πN experimental data, and disagree with the predictions obtained within the framework of the heavy-baryon Chiral-Perturbation Theory.
Departement: School of Engineering
Organisational Unit: Institute of Applied Mathematics and Physics (IAMP)
Institute of Mechatronic Systems (IMS)
Publication type: Article in scientific journal
DOI : 10.1142/S0217751X13500395
ISSN: 0217-751X
URI: https://digitalcollection.zhaw.ch/handle/11475/15774
Appears in Collections:Publikationen School of Engineering

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