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Title: Quantitative analysis of pixel crosstalk in AMOLED displays
Authors : Diethelm, Matthias
Penninck, Lieven
Altazin, Stéphane
Hiestand, Roman
Kirsch, Christoph
Ruhstaller, Beat
Published in : Journal of information display
Volume(Issue) : 19
Issue : 2
Pages : 61
Pages to: 69
Publisher / Ed. Institution : Taylor & Francis
Issue Date: 2018
License (according to publishing contract) : CC BY 4.0: Attribution 4.0 International
Type of review: Peer review (Publication)
Language : English
Subjects : OLED; Display; Crosstalk; Simulation; Laoss
Subject (DDC) : 621.3: Electrical engineering and electronics
Abstract: The resolution of organic light-emitting diode (OLED) displays is increasing steadily as these displays are adopted for mobile and virtual reality (VR) devices. This leads to a stronger pixel crosstalk effect, where the neighbors of active pixels unintentionally emit light due to a lateral electric current between the pixels. Recently, the crosstalk was quantified by measuring the current flowing through the common hole transport layer between the neighboring pixels and comparing it to the current through the active pixel diode [S.-K. Kwon, K.-S. Kim, H.-C. Choi and J. H. Kwon, presented at the International Meeting on Information Display, Jeju, South Korea, 2016]. The measurements showed that the crosstalk is more crucial for low light levels. In such cases, the intended and parasitic currents are similar. The simulations performed in this study validated these measurement results. By simulations, we quantify the crosstalk current through the diode. The luminous intensity can be calculated with the measured current efficiency of the diodes. For low light levels, the unintended luminance can reach up to 40% of the intended luminance. The luminance due to pixel crosstalk is perceivable by humans. This effect should be considered for OLED displays with resolutions higher than 300 PPI.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Article in scientific Journal
DOI : 10.21256/zhaw-3369
ISSN: 1598-0316
Appears in Collections:Publikationen School of Engineering

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