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dc.contributor.authorHeber, Steffen-
dc.contributor.authorSick, Beate-
dc.date.accessioned2018-12-19T13:52:10Z-
dc.date.available2018-12-19T13:52:10Z-
dc.date.issued2006-
dc.identifier.isbn1-59593-315-8de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/14002-
dc.description.abstractComputing reliable gene expression levels from microarray experiments is a sophisticated process with many potential pitfalls. Quality control is one of the most important steps in this process. We present a web based expert system for automatic quality assessment of Affymetrix GeneChip data. Our approach combines multiple quality metrics with supervised machine learning in order to identify data of low quality. Our system approximates expert opinion as represented in a knowledge base consisting of 41 microarray experiments with 352 CEL files annotated by a domain expert. GeneChips of low quality are detected automatically and can be excluded from subsequent analysis. This is especially important for large experiments or can assist the inexperienced users. Our expert system is fully implemented and integrated into a publicly available remote analysis computation engine for gene expression data.de_CH
dc.language.isoende_CH
dc.publisherAssociation for Computing Machineryde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectExpert systemde_CH
dc.subjectQuality assessmentde_CH
dc.subjectMicroarrayde_CH
dc.subject.ddc005: Computerprogrammierung, Programme und Datende_CH
dc.subject.ddc570: Biologiede_CH
dc.titleAutomatic quality assessment of Affymetrix GeneChip datade_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitut für Datenanalyse und Prozessdesign (IDP)de_CH
dc.identifier.doi10.1145/1185448.1185540de_CH
zhaw.conference.details44th ACM Southeast Regional Conference, Melbourne FL, USA, 10-12 March 2006de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end416de_CH
zhaw.pages.start411de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.publication.reviewNot specifiedde_CH
zhaw.title.proceedingsProceedings of the 44th annual Southeast regional conferencede_CH
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Heber, S., & Sick, B. (2006). Automatic quality assessment of Affymetrix GeneChip data [Conference paper]. Proceedings of the 44th Annual Southeast Regional Conference, 411–416. https://doi.org/10.1145/1185448.1185540
Heber, S. and Sick, B. (2006) ‘Automatic quality assessment of Affymetrix GeneChip data’, in Proceedings of the 44th annual Southeast regional conference. Association for Computing Machinery, pp. 411–416. Available at: https://doi.org/10.1145/1185448.1185540.
S. Heber and B. Sick, “Automatic quality assessment of Affymetrix GeneChip data,” in Proceedings of the 44th annual Southeast regional conference, 2006, pp. 411–416. doi: 10.1145/1185448.1185540.
HEBER, Steffen und Beate SICK, 2006. Automatic quality assessment of Affymetrix GeneChip data. In: Proceedings of the 44th annual Southeast regional conference. Conference paper. Association for Computing Machinery. 2006. S. 411–416. ISBN 1-59593-315-8
Heber, Steffen, and Beate Sick. 2006. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Conference paper. In Proceedings of the 44th Annual Southeast Regional Conference, 411–16. Association for Computing Machinery. https://doi.org/10.1145/1185448.1185540.
Heber, Steffen, and Beate Sick. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Proceedings of the 44th Annual Southeast Regional Conference, Association for Computing Machinery, 2006, pp. 411–16, https://doi.org/10.1145/1185448.1185540.


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