Publikationstyp: Konferenz: Paper
Art der Begutachtung: Keine Angabe
Titel: Automatic quality assessment of Affymetrix GeneChip data
Autor/-in: Heber, Steffen
Sick, Beate
DOI: 10.1145/1185448.1185540
Tagungsband: Proceedings of the 44th annual Southeast regional conference
Seite(n): 411
Seiten bis: 416
Angaben zur Konferenz: 44th ACM Southeast Regional Conference, Melbourne FL, USA, 10-12 March 2006
Erscheinungsdatum: 2006
Verlag / Hrsg. Institution: Association for Computing Machinery
ISBN: 1-59593-315-8
Sprache: Englisch
Schlagwörter: Expert system; Quality assessment; Microarray
Fachgebiet (DDC): 005: Computerprogrammierung, Programme und Daten
570: Biologie
Zusammenfassung: Computing reliable gene expression levels from microarray experiments is a sophisticated process with many potential pitfalls. Quality control is one of the most important steps in this process. We present a web based expert system for automatic quality assessment of Affymetrix GeneChip data. Our approach combines multiple quality metrics with supervised machine learning in order to identify data of low quality. Our system approximates expert opinion as represented in a knowledge base consisting of 41 microarray experiments with 352 CEL files annotated by a domain expert. GeneChips of low quality are detected automatically and can be excluded from subsequent analysis. This is especially important for large experiments or can assist the inexperienced users. Our expert system is fully implemented and integrated into a publicly available remote analysis computation engine for gene expression data.
URI: https://digitalcollection.zhaw.ch/handle/11475/14002
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: School of Engineering
Organisationseinheit: Institut für Datenanalyse und Prozessdesign (IDP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Heber, S., & Sick, B. (2006). Automatic quality assessment of Affymetrix GeneChip data [Conference paper]. Proceedings of the 44th Annual Southeast Regional Conference, 411–416. https://doi.org/10.1145/1185448.1185540
Heber, S. and Sick, B. (2006) ‘Automatic quality assessment of Affymetrix GeneChip data’, in Proceedings of the 44th annual Southeast regional conference. Association for Computing Machinery, pp. 411–416. Available at: https://doi.org/10.1145/1185448.1185540.
S. Heber and B. Sick, “Automatic quality assessment of Affymetrix GeneChip data,” in Proceedings of the 44th annual Southeast regional conference, 2006, pp. 411–416. doi: 10.1145/1185448.1185540.
HEBER, Steffen und Beate SICK, 2006. Automatic quality assessment of Affymetrix GeneChip data. In: Proceedings of the 44th annual Southeast regional conference. Conference paper. Association for Computing Machinery. 2006. S. 411–416. ISBN 1-59593-315-8
Heber, Steffen, and Beate Sick. 2006. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Conference paper. In Proceedings of the 44th Annual Southeast Regional Conference, 411–16. Association for Computing Machinery. https://doi.org/10.1145/1185448.1185540.
Heber, Steffen, and Beate Sick. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Proceedings of the 44th Annual Southeast Regional Conference, Association for Computing Machinery, 2006, pp. 411–16, https://doi.org/10.1145/1185448.1185540.


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