Publikationstyp: | Konferenz: Paper |
Art der Begutachtung: | Keine Angabe |
Titel: | Automatic quality assessment of Affymetrix GeneChip data |
Autor/-in: | Heber, Steffen Sick, Beate |
DOI: | 10.1145/1185448.1185540 |
Tagungsband: | Proceedings of the 44th annual Southeast regional conference |
Seite(n): | 411 |
Seiten bis: | 416 |
Angaben zur Konferenz: | 44th ACM Southeast Regional Conference, Melbourne FL, USA, 10-12 March 2006 |
Erscheinungsdatum: | 2006 |
Verlag / Hrsg. Institution: | Association for Computing Machinery |
ISBN: | 1-59593-315-8 |
Sprache: | Englisch |
Schlagwörter: | Expert system; Quality assessment; Microarray |
Fachgebiet (DDC): | 005: Computerprogrammierung, Programme und Daten 570: Biologie |
Zusammenfassung: | Computing reliable gene expression levels from microarray experiments is a sophisticated process with many potential pitfalls. Quality control is one of the most important steps in this process. We present a web based expert system for automatic quality assessment of Affymetrix GeneChip data. Our approach combines multiple quality metrics with supervised machine learning in order to identify data of low quality. Our system approximates expert opinion as represented in a knowledge base consisting of 41 microarray experiments with 352 CEL files annotated by a domain expert. GeneChips of low quality are detected automatically and can be excluded from subsequent analysis. This is especially important for large experiments or can assist the inexperienced users. Our expert system is fully implemented and integrated into a publicly available remote analysis computation engine for gene expression data. |
URI: | https://digitalcollection.zhaw.ch/handle/11475/14002 |
Volltext Version: | Publizierte Version |
Lizenz (gemäss Verlagsvertrag): | Lizenz gemäss Verlagsvertrag |
Departement: | School of Engineering |
Organisationseinheit: | Institut für Datenanalyse und Prozessdesign (IDP) |
Enthalten in den Sammlungen: | Publikationen School of Engineering |
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Heber, S., & Sick, B. (2006). Automatic quality assessment of Affymetrix GeneChip data [Conference paper]. Proceedings of the 44th Annual Southeast Regional Conference, 411–416. https://doi.org/10.1145/1185448.1185540
Heber, S. and Sick, B. (2006) ‘Automatic quality assessment of Affymetrix GeneChip data’, in Proceedings of the 44th annual Southeast regional conference. Association for Computing Machinery, pp. 411–416. Available at: https://doi.org/10.1145/1185448.1185540.
S. Heber and B. Sick, “Automatic quality assessment of Affymetrix GeneChip data,” in Proceedings of the 44th annual Southeast regional conference, 2006, pp. 411–416. doi: 10.1145/1185448.1185540.
HEBER, Steffen und Beate SICK, 2006. Automatic quality assessment of Affymetrix GeneChip data. In: Proceedings of the 44th annual Southeast regional conference. Conference paper. Association for Computing Machinery. 2006. S. 411–416. ISBN 1-59593-315-8
Heber, Steffen, and Beate Sick. 2006. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Conference paper. In Proceedings of the 44th Annual Southeast Regional Conference, 411–16. Association for Computing Machinery. https://doi.org/10.1145/1185448.1185540.
Heber, Steffen, and Beate Sick. “Automatic Quality Assessment of Affymetrix GeneChip Data.” Proceedings of the 44th Annual Southeast Regional Conference, Association for Computing Machinery, 2006, pp. 411–16, https://doi.org/10.1145/1185448.1185540.
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