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Aug-2021
Advanced characterization and device simulation towards better understanding of OLED degradation mechanisms
Regnat, M.
;
Jenatsch, S.
;
Züfle, S.
;
Pernstich, K. P.
;
Ruhstaller, B.
27-Aug-2018
Analysis of the bias-dependent split emission zone in phosphorescent OLEDs
Regnat, Markus
;
Pernstich, Kurt P.
;
Züfle, Simon
;
Ruhstaller, Beat
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Pernstich, Kurt
1
Jenatsch, S.
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621.3: Elektro-, Kommunikations-,...
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2018
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2021
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