Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Knapp, Evelyne | - |
dc.contributor.author | Ruhstaller, Beat | - |
dc.date.accessioned | 2018-06-18T09:36:32Z | - |
dc.date.available | 2018-06-18T09:36:32Z | - |
dc.date.issued | 2011 | - |
dc.identifier.issn | 0003-6951 | de_CH |
dc.identifier.issn | 1077-3118 | de_CH |
dc.identifier.uri | https://digitalcollection.zhaw.ch/handle/11475/7039 | - |
dc.description.abstract | We present a comprehensive numerical impedance spectroscopy analysis of an organic semiconductor device. A physical model that considers localized states is combined with a space- and frequency-resolved numerical framework. We study the details of the frequency-dependent capacitance of an electron-only device and distinguish different trapping regimes depending on the parameters. Depending on the choice of the trapping parameters, a capacitance rise at low frequency is observed. The extraction of the characteristic temperature of the exponential of the trap density of states (DOS) by a simplified method by T. Okachi et al. [Appl. Phys. Lett. 94, 043301(2009)] is investigated. | de_CH |
dc.language.iso | en | de_CH |
dc.publisher | American Institute of Physics | de_CH |
dc.relation.ispartof | Applied Physics Letters | de_CH |
dc.rights | Licence according to publishing contract | de_CH |
dc.subject.ddc | 530: Physik | de_CH |
dc.subject.ddc | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik | de_CH |
dc.title | Numerical impedance analysis for organic semiconductors with exponential distribution of localized states | de_CH |
dc.type | Beitrag in wissenschaftlicher Zeitschrift | de_CH |
dcterms.type | Text | de_CH |
zhaw.departement | School of Engineering | de_CH |
zhaw.organisationalunit | Institute of Computational Physics (ICP) | de_CH |
dc.identifier.doi | 10.1063/1.3633109 | de_CH |
zhaw.funding.eu | No | de_CH |
zhaw.issue | 9 | de_CH |
zhaw.originated.zhaw | Yes | de_CH |
zhaw.publication.status | publishedVersion | de_CH |
zhaw.volume | 99 | de_CH |
zhaw.publication.review | Peer review (Publikation) | de_CH |
Appears in collections: | Publikationen School of Engineering |
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Knapp, E., & Ruhstaller, B. (2011). Numerical impedance analysis for organic semiconductors with exponential distribution of localized states. Applied Physics Letters, 99(9). https://doi.org/10.1063/1.3633109
Knapp, E. and Ruhstaller, B. (2011) ‘Numerical impedance analysis for organic semiconductors with exponential distribution of localized states’, Applied Physics Letters, 99(9). Available at: https://doi.org/10.1063/1.3633109.
E. Knapp and B. Ruhstaller, “Numerical impedance analysis for organic semiconductors with exponential distribution of localized states,” Applied Physics Letters, vol. 99, no. 9, 2011, doi: 10.1063/1.3633109.
KNAPP, Evelyne und Beat RUHSTALLER, 2011. Numerical impedance analysis for organic semiconductors with exponential distribution of localized states. Applied Physics Letters. 2011. Bd. 99, Nr. 9. DOI 10.1063/1.3633109
Knapp, Evelyne, and Beat Ruhstaller. 2011. “Numerical Impedance Analysis for Organic Semiconductors with Exponential Distribution of Localized States.” Applied Physics Letters 99 (9). https://doi.org/10.1063/1.3633109.
Knapp, Evelyne, and Beat Ruhstaller. “Numerical Impedance Analysis for Organic Semiconductors with Exponential Distribution of Localized States.” Applied Physics Letters, vol. 99, no. 9, 2011, https://doi.org/10.1063/1.3633109.
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