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dc.contributor.authorKnapp, Evelyne-
dc.contributor.authorRuhstaller, Beat-
dc.date.accessioned2018-06-18T09:36:32Z-
dc.date.available2018-06-18T09:36:32Z-
dc.date.issued2011-
dc.identifier.issn0003-6951de_CH
dc.identifier.issn1077-3118de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/7039-
dc.description.abstractWe present a comprehensive numerical impedance spectroscopy analysis of an organic semiconductor device. A physical model that considers localized states is combined with a space- and frequency-resolved numerical framework. We study the details of the frequency-dependent capacitance of an electron-only device and distinguish different trapping regimes depending on the parameters. Depending on the choice of the trapping parameters, a capacitance rise at low frequency is observed. The extraction of the characteristic temperature of the exponential of the trap density of states (DOS) by a simplified method by T. Okachi et al. [Appl. Phys. Lett. 94, 043301(2009)] is investigated.de_CH
dc.language.isoende_CH
dc.publisherAmerican Institute of Physicsde_CH
dc.relation.ispartofApplied Physics Lettersde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc530: Physikde_CH
dc.subject.ddc621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnikde_CH
dc.titleNumerical impedance analysis for organic semiconductors with exponential distribution of localized statesde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1063/1.3633109de_CH
zhaw.funding.euNode_CH
zhaw.issue9de_CH
zhaw.originated.zhawYesde_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume99de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
Appears in collections:Publikationen School of Engineering

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Knapp, E., & Ruhstaller, B. (2011). Numerical impedance analysis for organic semiconductors with exponential distribution of localized states. Applied Physics Letters, 99(9). https://doi.org/10.1063/1.3633109
Knapp, E. and Ruhstaller, B. (2011) ‘Numerical impedance analysis for organic semiconductors with exponential distribution of localized states’, Applied Physics Letters, 99(9). Available at: https://doi.org/10.1063/1.3633109.
E. Knapp and B. Ruhstaller, “Numerical impedance analysis for organic semiconductors with exponential distribution of localized states,” Applied Physics Letters, vol. 99, no. 9, 2011, doi: 10.1063/1.3633109.
KNAPP, Evelyne und Beat RUHSTALLER, 2011. Numerical impedance analysis for organic semiconductors with exponential distribution of localized states. Applied Physics Letters. 2011. Bd. 99, Nr. 9. DOI 10.1063/1.3633109
Knapp, Evelyne, and Beat Ruhstaller. 2011. “Numerical Impedance Analysis for Organic Semiconductors with Exponential Distribution of Localized States.” Applied Physics Letters 99 (9). https://doi.org/10.1063/1.3633109.
Knapp, Evelyne, and Beat Ruhstaller. “Numerical Impedance Analysis for Organic Semiconductors with Exponential Distribution of Localized States.” Applied Physics Letters, vol. 99, no. 9, 2011, https://doi.org/10.1063/1.3633109.


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