Publikationstyp: Konferenz: Paper
Art der Begutachtung: Peer review (Publikation)
Titel: Clustering phenomena in coupled chaotic circuits with different coupling strength
Autor/-in: Uwate, Yoko
Ott, Thomas
Nishio, Yoshifumi
DOI: 10.1109/ECCTD.2013.6662220
Angaben zur Konferenz: European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013
Erscheinungsdatum: 2013
ISBN: 978-3-00-043785-4
Sprache: Englisch
Schlagwörter: Chaotic; Circuit; Clustering
Fachgebiet (DDC): 003: Systeme
URI: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6662220
https://digitalcollection.zhaw.ch/handle/11475/4413
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: Life Sciences und Facility Management
Organisationseinheit: Institut für Computational Life Sciences (ICLS)
Enthalten in den Sammlungen:Publikationen Life Sciences und Facility Management

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Uwate, Y., Ott, T., & Nishio, Y. (2013). Clustering phenomena in coupled chaotic circuits with different coupling strength. European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. https://doi.org/10.1109/ECCTD.2013.6662220
Uwate, Y., Ott, T. and Nishio, Y. (2013) ‘Clustering phenomena in coupled chaotic circuits with different coupling strength’, in European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. Available at: https://doi.org/10.1109/ECCTD.2013.6662220.
Y. Uwate, T. Ott, and Y. Nishio, “Clustering phenomena in coupled chaotic circuits with different coupling strength,” in European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013, 2013. doi: 10.1109/ECCTD.2013.6662220.
UWATE, Yoko, Thomas OTT und Yoshifumi NISHIO, 2013. Clustering phenomena in coupled chaotic circuits with different coupling strength. In: European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013 [online]. Conference paper. 2013. ISBN 978-3-00-043785-4. Verfügbar unter: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6662220
Uwate, Yoko, Thomas Ott, and Yoshifumi Nishio. 2013. “Clustering Phenomena in Coupled Chaotic Circuits with Different Coupling Strength.” Conference paper. In European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013. https://doi.org/10.1109/ECCTD.2013.6662220.
Uwate, Yoko, et al. “Clustering Phenomena in Coupled Chaotic Circuits with Different Coupling Strength.” European Conference on Circuit Theory and Design (ECCTD), Dresden, Deutschland, 8-12 September 2013, 2013, https://doi.org/10.1109/ECCTD.2013.6662220.


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