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dc.contributor.authorAltazin, S.-
dc.contributor.authorZüfle, Simon-
dc.contributor.authorKnapp, Evelyne-
dc.contributor.authorKirsch, Christoph-
dc.contributor.authorSchmidt, T.D.-
dc.contributor.authorJäger, L.-
dc.contributor.authorNoguchi, Y.-
dc.contributor.authorBrütting, W.-
dc.contributor.authorRuhstaller, Beat-
dc.date.accessioned2018-02-14T08:12:00Z-
dc.date.available2018-02-14T08:12:00Z-
dc.date.issued2016-12-
dc.identifier.issn1566-1199de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/2768-
dc.description.abstractOrganic light-emitting diodes (OLEDs) rely on the use of functional materials with suitable energy levels and mobilities for selective charge carrier injection and transport of one species only at the respective electrode. Until recently, however, the dipolar nature of many organic semiconductors has been largely ignored in this context. In particular, electron transports layers (ETLs) often exhibit spontaneous orientation polarization leading to interfacial charges that modify the electrical potential landscape inside a hetero-layer device. Here we demonstrate that the effect of polar ETLs can be simulated using the well-established Poisson and drift-diffusion formalism, if these interfacial charges are taken into account. Impedance spectroscopy is used in order to validate our approach and to characterize the polarity of the material. Finally, simulations allow to quantify the impact of polar ETLs on device performance.de_CH
dc.language.isoende_CH
dc.publisherElsevierde_CH
dc.relation.ispartofOrganic Electronicsde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc621.3: Elektrotechnik und Elektronikde_CH
dc.titleSimulation of OLEDs with a polar electron transport layerde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1016/j.orgel.2016.10.014de_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end249de_CH
zhaw.pages.start244de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume39de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
Appears in Collections:Publikationen School of Engineering

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