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  2. School of Engineering
  3. Publikationen
  4. Publikationen School of Engineering
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dc.contributor.authorHolzer, Lorenz-
dc.contributor.authorCantoni, Marco-
dc.date.accessioned2018-01-25T11:18:32Z-
dc.date.available2018-01-25T11:18:32Z-
dc.date.issued2012-
dc.identifier.isbn978-0-19-973421-4de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/2203-
dc.language.isoende_CH
dc.publisherOxford University Pressde_CH
dc.relation.ispartofNanofabrication using focused ion and electron beams : principles and applicationsde_CH
dc.relation.ispartofseriesOxford series in nanomanufacturingde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subjectMapde_CH
dc.subject.ddc620.11: Werkstoffede_CH
dc.titleReview of FIB tomographyde_CH
dc.typeBuchbeitragde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
zhaw.publisher.placeNew Yorkde_CH
zhaw.funding.euNode_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end435de_CH
zhaw.pages.start410de_CH
zhaw.parentwork.editorUtke, Ivo-
zhaw.parentwork.editorMoshkalev, Stanislav-
zhaw.parentwork.editorRussel, Philip E.-
zhaw.publication.statuspublishedVersionde_CH
zhaw.publication.reviewEditorial reviewde_CH
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Holzer, L., & Cantoni, M. (2012). Review of FIB tomography. In I. Utke, S. Moshkalev, & P. E. Russel (Eds.), Nanofabrication using focused ion and electron beams : principles and applications (pp. 410–435). Oxford University Press.
Holzer, L. and Cantoni, M. (2012) ‘Review of FIB tomography’, in I. Utke, S. Moshkalev, and P.E. Russel (eds) Nanofabrication using focused ion and electron beams : principles and applications. New York: Oxford University Press, pp. 410–435.
L. Holzer and M. Cantoni, “Review of FIB tomography,” in Nanofabrication using focused ion and electron beams : principles and applications, I. Utke, S. Moshkalev, and P. E. Russel, Eds. New York: Oxford University Press, 2012, pp. 410–435.
HOLZER, Lorenz und Marco CANTONI, 2012. Review of FIB tomography. In: Ivo UTKE, Stanislav MOSHKALEV und Philip E. RUSSEL (Hrsg.), Nanofabrication using focused ion and electron beams : principles and applications. New York: Oxford University Press. S. 410–435. ISBN 978-0-19-973421-4
Holzer, Lorenz, and Marco Cantoni. 2012. “Review of FIB Tomography.” In Nanofabrication Using Focused Ion and Electron Beams : Principles and Applications, edited by Ivo Utke, Stanislav Moshkalev, and Philip E. Russel, 410–35. New York: Oxford University Press.
Holzer, Lorenz, and Marco Cantoni. “Review of FIB Tomography.” Nanofabrication Using Focused Ion and Electron Beams : Principles and Applications, edited by Ivo Utke et al., Oxford University Press, 2012, pp. 410–35.


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