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dc.contributor.authorBraga, Daniele-
dc.contributor.authorJenatsch, Sandra-
dc.contributor.authorPenninck, Lieven-
dc.contributor.authorHiestand, Roman-
dc.contributor.authorDiethelm, Matthias-
dc.contributor.authorAltazin, Stéphane-
dc.contributor.authorKirsch, Christoph-
dc.contributor.authorRuhstaller, Beat-
dc.date.accessioned2020-03-05T12:46:55Z-
dc.date.available2020-03-05T12:46:55Z-
dc.date.issued2019-
dc.identifier.issn0097-966Xde_CH
dc.identifier.issn2168-0159de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/19632-
dc.description.abstractWe achieved a quantitative understanding of both electrical and optical coupling in OLED displays, by employing the simulation software LAOSS. For an AMOLED of around 300 PPI we found that the relative luminance between the addressed pixel and the neighbors can be as high as 40%, hampering significantly the quality of the final image. Similarly, in WOLEDs/CFs the light leakage to the neighboring pixels is clearly detectable, especially for wavelengths in the blue region of the spectrum.de_CH
dc.language.isoende_CH
dc.publisherWileyde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc530: Physikde_CH
dc.titleModeling electrical and optical cross‐talk between adjacent pixels in organic light‐emitting diode displaysde_CH
dc.typeKonferenz: Paperde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitute of Computational Physics (ICP)de_CH
dc.identifier.doi10.1002/sdtp.13083de_CH
zhaw.conference.detailsInternational Conference on Display Technology 2020 (ICDT), Kunshan, China, 26-29 March 2019de_CH
zhaw.funding.euNode_CH
zhaw.issue1de_CH
zhaw.originated.zhawYesde_CH
zhaw.pages.end956de_CH
zhaw.pages.start953de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume50de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
zhaw.title.proceedingsSID International Symposium : Digest of Technical Papersde_CH
zhaw.author.additionalNode_CH
Appears in Collections:Publikationen School of Engineering

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