|Title:||Method for characterizing particles producing heat exposed to light and device for carrying out the method|
|Inventor :||Geers, Christoph|
|Patent submitter:||Adolphe Merkle Institute, University of Fribourg|
|Abstract:||A method for characterizing particles producing heat when exposed to light is proposed. The method comprises the steps of stimulating a particle sample (2e) alternatingly with homogenous light waves (8a, 10a, 12a, 14a) with at least a first wavelength and a second wavelength, detecting by means of a detector (18a) heat (16a) radiated by the particle sample as a result of the stimulation, thereby yielding time-dependent images of a modulated heat distribution pattern, converting the time-dependent image of the modulated heat distribution pattern into the frequency domain and demodulating the image of the modulated heat distribution pattern, and determining a physical property of the particle sample based on the at least one demodulated image of heat distribution.|
|Departement:||School of Engineering|
|Organisational Unit:||Institute of Computational Physics (ICP)|
|Appears in Collections:||Patente School of Engineering|
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