Title: Method for characterizing particles producing heat exposed to light and device for carrying out the method
Inventor : Geers, Christoph
Bonmarin, Mathias
Fink, Alke
Monnier, Christophe
Patent submitter: Adolphe Merkle Institute, University of Fribourg
Issue Date: 12-Jun-2018
Language : English
Abstract: A method for characterizing particles producing heat when exposed to light is proposed. The method comprises the steps of stimulating a particle sample (2e) alternatingly with homogenous light waves (8a, 10a, 12a, 14a) with at least a first wavelength and a second wavelength, detecting by means of a detector (18a) heat (16a) radiated by the particle sample as a result of the stimulation, thereby yielding time-dependent images of a modulated heat distribution pattern, converting the time-dependent image of the modulated heat distribution pattern into the frequency domain and demodulating the image of the modulated heat distribution pattern, and determining a physical property of the particle sample based on the at least one demodulated image of heat distribution.
Departement: School of Engineering
Organisational Unit: Institute of Computational Physics (ICP)
Publication type: Patent
Patentnumber : WO2018219610
metadata.zhaw.publication.code: A1
URI: https://register.epo.org/application?number=EP18723504
https://digitalcollection.zhaw.ch/handle/11475/17977
Appears in Collections:Patente School of Engineering

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