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Issue DateTitleAuthor(s)
2011-02-01Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheresHolzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel; Wiedenmann, Daniel; Vogt, Uli; Holtappels, Peter; Sfeir, Josef; Mai, Andreas; Graule, Thomas
2011-08Automated, model-based analysis of Uj-data for electrolyte-supported SOFC short-stacksLinder, Markus; Hocker, Thomas; Denzler, Roland; Mai, Andreas; Iwanschitz, Boris
2012-03Nickel agglomeration in solid oxide fuel cells : the influence of temperatureIwanschitz, Boris; Holzer, Lorenz; Mai, Andreas; Schütze, Michael
2014Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopyLinder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas
2015-08-15A model-based approach for current voltage analyses to quantify degradation and fuel distribution in solid oxide fuel cell stacksLinder, Markus; Hocker, Thomas; Meier, Christoph; Holzer, Lorenz; Friedrich, Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, Andreas J.
2013-12-01Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operationLinder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas
2015Ohmic resistance of nickel infiltrated chromium oxide scales in solid oxide fuel cell metallic interconnectsLinder, Markus; Hocker, Thomas; Holzer, Lorenz; Pecho, Omar; Friedrich, Andreas; Morawietz, Thomas; Hiesgen, Renate; Kontic, Roman; Iwanschitz, Boris; Mai, Andreas; Schuler, Andreas