| Issue Date | Title | Involved Person(s) |
| 1-Feb-2011 | Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheres | Holzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel; Wiedenmann, Daniel; Vogt, Uli; Holtappels, Peter; Sfeir, Josef; Mai, Andreas; Graule, Thomas |
| 20-Apr-2021 | Comprehensive model for CGO based anodes | Marmet, Philip; Holzer, Lorenz; Grolig, Jan G.; Mai, Andreas; Brader, Joseph M.; Hocker, Thomas |
| 2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas |
| 1-Dec-2013 | Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas |
| 2011 | Automated, model-based analysis of Uj-data for electrolyte-supported SOFC short-stacks | Linder, Markus; Hocker, Thomas; Denzler, Roland; Mai, Andreas; Iwanschitz, Boris |
| 5-Jul-2022 | Composite conductivity of MIEC-based SOFC anodes : implications for microstructure optimization | Marmet, Philip; Hocker, Thomas; Boiger, Gernot K.; Grolig, Jan G.; Bausinger, Holger; Mai, Andreas; Fingerle, Mathias; Reeb, Sarah; Brader, Joseph M.; Holzer, Lorenz |
| 25-Apr-2023 | Standardized microstructure characterization of SOC electrodes as a key element for Digital Materials Design | Marmet, Philip; Holzer, Lorenz; Hocker, Thomas; Boiger, Gernot K.; Bausinger, Holger; Mai, Andreas; Fingerle, Mathias; Reeb, Sarah; Michel, Dominik; Brader, Joseph M. |
