Issue Date | Title | Involved Person(s) |
25-Feb-2014 | Quantitative relationships between microstructure and effective transport properties based on virtual materials testing | Gaiselmann, Gerd; Neumann, Matthias; Schmidt, Volker; Pecho, Omar; Hocker, Thomas, et al |
2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
1-Dec-2013 | Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
Feb-2013 | Stochastic 3D modeling of La0.6Sr0.4CoO3−δ cathodes based on structural segmentation of FIB–SEM images | Gaiselmann, Gerd; Neumann, Matthias; Holzer, Lorenz; Hocker, Thomas; Prestat, Michel René, et al |
1-Feb-2011 | Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheres | Holzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel, et al |