Issue Date | Title | Involved Person(s) |
25-Feb-2014 | Quantitative relationships between microstructure and effective transport properties based on virtual materials testing | Gaiselmann, Gerd; Neumann, Matthias; Schmidt, Volker; Pecho, Omar; Hocker, Thomas, et al |
2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |