Issue Date | Title | Involved Person(s) |
2001 | Studiengang Datenanalyse und Prozessdesign an der Zürcher Hochschule Winterthur | Strankmann, Manfred; Müller, Marianne; Ruckstuhl, Andreas |
2001 | Influence of magnetic fields on the coherence effects in the Na I D1 and D2 lines | Stenflo, J. O.; Gandorfer, A.; Wenzler, T.; Keller, C. U. |
2001 | Vermeiden und verwerten : Baustoffrecycling | Kunz, Markus |
2001 | Der Beitrag des IMS zur Lehre | Büchi, Roland |
May-2000 | Comparing and evaluating pesticide leaching models : results for the Tor Mancina data set (Italy) | Francaviglia, R.; Capri, E.; Klein, M.; Hosang, Jürg; Aden, K., et al |
May-2000 | Comparing and Evaluating Pesticide Leaching Models : Results of Simulations with PELMO | Klein, M.; Hosang, Jürg; Schäfer, H.; Erzgräber, B.; Resseler, H. |
May-2000 | Smooth stable planes and the moduli spaces of locally compact translation planes | Bödi, Richard; Immervoll, Stefan; Löwe, Harald |
May-2000 | Stable and unstable formulations of the convection operator in spectral element simulations | Wilhelm, Dirk; Kleiser, Leonhard |
4-Feb-2000 | Bias-tuned reduction of self-absorption in polymer blend electroluminescence | Ruhstaller, Beat; Scott, J.C.; Brock, P.J.; Scherf, Ullrich; Carter, S.A. |
2000 | Flight control design : best practices | Moorhouse, David J.; de Boer, Wim; Fielding, Chris; Hahn, Klaus-Uwe; Hofinger, Georg, et al |
2000 | Mehrteilige modulare Reibwerkzeuge | Agarico, Jörg |
2000 | Numerical simulation of silicon solar cells with novel cell structures | Wettling, Wolfram; Bucher, Ernst; Schumacher, Jürgen |
2000 | The extraction of the surface recombination velocity of Si:P emitters using advanced silicon models | Altermatt, Pietro; Schumacher, Jürgen; Cuevas, Andres; Glunz, Stefan; King, Richard, et al |
2000 | Coatings with siloxane layers in nanoscale thickness : hydrophobization, adhesion promotion, corrosion protection | Hirayama, Martina; Caseri, Walter; Suter, Ulrich |
2000 | Scanning near-field optical microscopy with aperture probes : fundamentals and applications | Hecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato, et al |