Issue Date | Title | Involved Person(s) |
2000 | Numerical simulation of silicon solar cells with novel cell structures | Wettling, Wolfram; Bucher, Ernst; Schumacher, Jürgen |
2000 | The extraction of the surface recombination velocity of Si:P emitters using advanced silicon models | Altermatt, Pietro; Schumacher, Jürgen; Cuevas, Andres; Glunz, Stefan; King, Richard, et al |
2000 | A stochastic cascade model for FX dynamics | Breymann, Wolfgang; Ghashghaie, Shoaleh; Talkner, Peter |
2000 | Coatings with siloxane layers in nanoscale thickness : hydrophobization, adhesion promotion, corrosion protection | Hirayama, Martina; Caseri, Walter; Suter, Ulrich |
2000 | Scanning near-field optical microscopy with aperture probes : fundamentals and applications | Hecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato, et al |
2000 | Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systems | Scheidegger, Stephan; Estermann, Michael Alexander; Steurer, Steurer |
2000 | Punktsieg für das Hartreiben | Agarico, Jörg |
2000 | Quantum chaotic scattering with a mixed phase space : the three-disk billiard in a magnetic field | Eichengrün, Markus; Schirmacher, Walter; Breymann, Wolfgang |
2000 | CGI Project methodology | Zimmerli, Frank; Rigley, Vanessa; Senti, Patrik; Gilardi, Simona; Baudinot, Gerold, et al |
2000 | Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers | Dicker, Jochen; Schumacher, Jürgen; Sölter, Jens; Zimmermann, Walter; Bau, Sandra, et al |
2000 | Konstituenten des Risikozentrieren Ethikkonzeptes (RZE) : Grundlagenpapier der Ethikkommission | Kuhn, Heinrich |
Jan-2000 | Nonparametric function estimation of the relationship between two repeatedly measured variables | Ruckstuhl, Andreas; Welsh, A.H.; Carroll, R.J. |
2000 | Superconducting gap and pseudogap in Bi-2212 | Opel, M.; Venturini, Francesca; Hackl, R.; Revaz, B.; Berger, H., et al |
2000 | Activated poly(hydromethylsiloxane)s as novel adhesion promoters for metallic surfaces | Hirayama, Martina; Soares, Marie; Caseri, Walter; Suter, Ulrich; Goussev, Olga |