Issue Date | Title | Involved Person(s) |
15-Aug-2015 | A model-based approach for current voltage analyses to quantify degradation and fuel distribution in solid oxide fuel cell stacks | Linder, Markus; Hocker, Thomas; Meier, Christoph; Holzer, Lorenz; Friedrich, Andreas, et al |
2015 | Ohmic resistance of nickel infiltrated chromium oxide scales in solid oxide fuel cell metallic interconnects | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Pecho, Omar; Friedrich, Andreas, et al |
2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
1-Dec-2013 | Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris, et al |
2011 | Automated, model-based analysis of Uj-data for electrolyte-supported SOFC short-stacks | Linder, Markus; Hocker, Thomas; Denzler, Roland; Mai, Andreas; Iwanschitz, Boris |