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2014
Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy
Linder, Markus
;
Hocker, Thomas
;
Holzer, Lorenz
;
Friedrich, K. Andreas
;
Iwanschitz, Boris
, et al
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Author
1
Linder, Markus
1
Schuler, J. Andreas
Subject (DDC)
1
530: Physik
1
621.3: Elektro-, Kommunikations-,...