Issue Date | Title | Involved Person(s) |
2014 | Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas |
1-Dec-2013 | Cr2O3 scale growth rates on metallic interconnectors derived from 40,000 h solid oxide fuel cell stack operation | Linder, Markus; Hocker, Thomas; Holzer, Lorenz; Friedrich, K. Andreas; Iwanschitz, Boris; Mai, Andreas; Schuler, J. Andreas |
1-Feb-2011 | Microstructure degradation of cermet anodes for solid oxide fuel cells : quantification of nickel grain growth in dry and in humid atmospheres | Holzer, Lorenz; Iwanschitz, Boris; Hocker, Thomas; Münch, Beat; Prestat, Michel; Wiedenmann, Daniel; Vogt, Uli; Holtappels, Peter; Sfeir, Josef; Mai, Andreas; Graule, Thomas |