Bitte benutzen Sie diese Kennung, um auf die Ressource zu verweisen:
https://doi.org/10.21256/zhaw-3370| Publikationstyp: | Beitrag in wissenschaftlicher Zeitschrift |
| Art der Begutachtung: | Peer review (Publikation) |
| Titel: | Opto-electronic characterization of third-generation solar cells |
| Autor/-in: | Neukom, Martin Züfle, Simon Jenatsch, Sandra Ruhstaller, Beat |
| DOI: | 10.21256/zhaw-3370 10.1080/14686996.2018.1442091 |
| Erschienen in: | Science and Technology of Advanced Materials |
| Band(Heft): | 19 |
| Heft: | 1 |
| Seite(n): | 291 |
| Seiten bis: | 316 |
| Erscheinungsdatum: | 2018 |
| Verlag / Hrsg. Institution: | Taylor & Francis |
| ISSN: | 1468-6996 1878-5514 |
| Sprache: | Englisch |
| Schlagwörter: | 209 Solar cell / Photovoltaics; 40 Optical, magnetic and electronic device material; CELIV; DLTS; IMPS; OCVD; TPC; TPV; Charge carrier mobility; Impedance spectroscopy; Organic solar cell; Perovskite solar cell |
| Fachgebiet (DDC): | 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik |
| Zusammenfassung: | We present an overview of opto-electronic characterization techniques for solar cells including light-induced charge extraction by linearly increasing voltage, impedance spectroscopy, transient photovoltage, charge extraction and more. Guidelines for the interpretation of experimental results are derived based on charge drift-diffusion simulations of solar cells with common performance limitations. It is investigated how nonidealities like charge injection barriers, traps and low mobilities among others manifest themselves in each of the studied cell characterization techniques. Moreover, comprehensive parameter extraction for an organic bulk-heterojunction solar cell comprising PCDTBT:PC70BM is demonstrated. The simulations reproduce measured results of 9 different experimental techniques. Parameter correlation is minimized due to the combination of various techniques. Thereby a route to comprehensive and accurate parameter extraction is identified. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/15629 |
| Volltext Version: | Publizierte Version |
| Lizenz (gemäss Verlagsvertrag): | CC BY 4.0: Namensnennung 4.0 International |
| Departement: | School of Engineering |
| Organisationseinheit: | Institut für Angewandte Mathematik und Physik (IAMP) |
| Publiziert im Rahmen des ZHAW-Projekts: | PV2050: Sustainability, market deployment and interaction to the grid – the impacts of advanced PV |
| Enthalten in den Sammlungen: | Publikationen School of Engineering |
Dateien zu dieser Ressource:
| Datei | Beschreibung | Größe | Format | |
|---|---|---|---|---|
| Neukom et al. - 2018 - Opto-electronic characterization of third-generati.pdf | 2.77 MB | Adobe PDF |  Öffnen/Anzeigen |
Zur Langanzeige
Neukom, M., Züfle, S., Jenatsch, S., & Ruhstaller, B. (2018). Opto-electronic characterization of third-generation solar cells. Science and Technology of Advanced Materials, 19(1), 291–316. https://doi.org/10.21256/zhaw-3370
Neukom, M. et al. (2018) ‘Opto-electronic characterization of third-generation solar cells’, Science and Technology of Advanced Materials, 19(1), pp. 291–316. Available at: https://doi.org/10.21256/zhaw-3370.
M. Neukom, S. Züfle, S. Jenatsch, and B. Ruhstaller, “Opto-electronic characterization of third-generation solar cells,” Science and Technology of Advanced Materials, vol. 19, no. 1, pp. 291–316, 2018, doi: 10.21256/zhaw-3370.
NEUKOM, Martin, Simon ZÜFLE, Sandra JENATSCH und Beat RUHSTALLER, 2018. Opto-electronic characterization of third-generation solar cells. Science and Technology of Advanced Materials. 2018. Bd. 19, Nr. 1, S. 291–316. DOI 10.21256/zhaw-3370
Neukom, Martin, Simon Züfle, Sandra Jenatsch, and Beat Ruhstaller. 2018. “Opto-Electronic Characterization of Third-Generation Solar Cells.” Science and Technology of Advanced Materials 19 (1): 291–316. https://doi.org/10.21256/zhaw-3370.
Neukom, Martin, et al. “Opto-Electronic Characterization of Third-Generation Solar Cells.” Science and Technology of Advanced Materials, vol. 19, no. 1, 2018, pp. 291–316, https://doi.org/10.21256/zhaw-3370.
Alle Ressourcen in diesem Repository sind urheberrechtlich geschützt, soweit nicht anderweitig angezeigt.