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|Publication type:||Article in scientific journal|
|Type of review:||Peer review (publication)|
|Title:||Opto-electronic characterization of third-generation solar cells|
|Published in:||Science and Technology of Advanced Materials|
|Publisher / Ed. Institution:||Taylor & Francis|
|Subjects:||209 Solar cell / Photovoltaics; 40 Optical, magnetic and electronic device material; CELIV; DLTS; IMPS; OCVD; TPC; TPV; Charge carrier mobility; Impedance spectroscopy; Organic solar cell; Perovskite solar cell|
|Subject (DDC):||621.3: Electrical, communications, control engineering|
|Abstract:||We present an overview of opto-electronic characterization techniques for solar cells including light-induced charge extraction by linearly increasing voltage, impedance spectroscopy, transient photovoltage, charge extraction and more. Guidelines for the interpretation of experimental results are derived based on charge drift-diffusion simulations of solar cells with common performance limitations. It is investigated how nonidealities like charge injection barriers, traps and low mobilities among others manifest themselves in each of the studied cell characterization techniques. Moreover, comprehensive parameter extraction for an organic bulk-heterojunction solar cell comprising PCDTBT:PC70BM is demonstrated. The simulations reproduce measured results of 9 different experimental techniques. Parameter correlation is minimized due to the combination of various techniques. Thereby a route to comprehensive and accurate parameter extraction is identified.|
|Fulltext version:||Published version|
|License (according to publishing contract):||CC BY 4.0: Attribution 4.0 International|
|Departement:||School of Engineering|
|Organisational Unit:||Institute of Applied Mathematics and Physics (IAMP)|
|Published as part of the ZHAW project:||PV2050: Sustainability, market deployment and interaction to the grid – the impacts of advanced PV|
|Appears in collections:||Publikationen School of Engineering|
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|Neukom et al. - 2018 - Opto-electronic characterization of third-generati.pdf||2.77 MB||Adobe PDF|
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Neukom, M., Züfle, S., Jenatsch, S., & Ruhstaller, B. (2018). Opto-electronic characterization of third-generation solar cells. Science and Technology of Advanced Materials, 19(1), 291–316. https://doi.org/10.21256/zhaw-3370
Neukom, M. et al. (2018) ‘Opto-electronic characterization of third-generation solar cells’, Science and Technology of Advanced Materials, 19(1), pp. 291–316. Available at: https://doi.org/10.21256/zhaw-3370.
M. Neukom, S. Züfle, S. Jenatsch, and B. Ruhstaller, “Opto-electronic characterization of third-generation solar cells,” Science and Technology of Advanced Materials, vol. 19, no. 1, pp. 291–316, 2018, doi: 10.21256/zhaw-3370.
Neukom, Martin, et al. “Opto-Electronic Characterization of Third-Generation Solar Cells.” Science and Technology of Advanced Materials, vol. 19, no. 1, 2018, pp. 291–316, https://doi.org/10.21256/zhaw-3370.
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