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Publikationstyp: Konferenz: Paper
Art der Begutachtung: Peer review (Publikation)
Titel: Pulsed-active microwave thermography
Autor/-in: Wilcox, Logan M.
Bonmarin, Mathias
Donnell, Kristen M.
et. al: No
DOI: 10.1109/I2MTC48687.2022.9806511
10.21256/zhaw-25345
Tagungsband: 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Seite(n): 1
Seiten bis: 6
Angaben zur Konferenz: IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Ottawa, Canada, 16-19 May 2022
Erscheinungsdatum: 30-Jun-2022
Verlag / Hrsg. Institution: IEEE
ISBN: 978-1-6654-8360-5
Sprache: Englisch
Schlagwörter: Nondestructive testing and evaluation; NDT&E; Pulsed thermography; PT; Active microwave thermography; AMT; Thermal Contrast; TC; Signal-to-Noise Ratio; SNR
Fachgebiet (DDC): 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik
Zusammenfassung: Active microwave thermography (AMT) is a thermographic nondestructive testing and evaluation techniquethat utilizes an electromagnetic-based excitation with a subsequent infrared measurement of the surface thermal profile of the material or structure of interest. AMT has been successfully applied to several aerospace and civil infrastructure applications. This work seeks to expand the performance of AMT by incorporating a signal processing technique common to traditional (flash-lamp) thermography, referred to as pulsed thermography (PT). PT operates on the premise of a pulsed excitation, as opposed to a constant or step excitation (ST) over a given time-period that is typical to traditional active thermography. This work applies the pulsed approach to AMT, herein referred to as P-AMT, and compares the thermal contrast (TC) and signal-to-noise ratio (SNR) of traditional and pulsed AMT inspections as applied to a moisture ingress detection need. The results suggest that the optimal heating time (indicated through SNR) for P-AMT is less than that of traditional AMT with a reduced overall (absolute) temperature. This is important as it relates to any inspection with concerns for thermal damage as well an overall reduction in required inspection time.
URI: https://digitalcollection.zhaw.ch/handle/11475/25345
Volltext Version: Akzeptierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: School of Engineering
Organisationseinheit: Institute of Computational Physics (ICP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Wilcox, L. M., Bonmarin, M., & Donnell, K. M. (2022). Pulsed-active microwave thermography [Conference paper]. 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 1–6. https://doi.org/10.1109/I2MTC48687.2022.9806511
Wilcox, L.M., Bonmarin, M. and Donnell, K.M. (2022) ‘Pulsed-active microwave thermography’, in 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). IEEE, pp. 1–6. Available at: https://doi.org/10.1109/I2MTC48687.2022.9806511.
L. M. Wilcox, M. Bonmarin, and K. M. Donnell, “Pulsed-active microwave thermography,” in 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Jun. 2022, pp. 1–6. doi: 10.1109/I2MTC48687.2022.9806511.
WILCOX, Logan M., Mathias BONMARIN und Kristen M. DONNELL, 2022. Pulsed-active microwave thermography. In: 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). Conference paper. IEEE. 30 Juni 2022. S. 1–6. ISBN 978-1-6654-8360-5
Wilcox, Logan M., Mathias Bonmarin, and Kristen M. Donnell. 2022. “Pulsed-Active Microwave Thermography.” Conference paper. In 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 1–6. IEEE. https://doi.org/10.1109/I2MTC48687.2022.9806511.
Wilcox, Logan M., et al. “Pulsed-Active Microwave Thermography.” 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), IEEE, 2022, pp. 1–6, https://doi.org/10.1109/I2MTC48687.2022.9806511.


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