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dc.contributor.authorHecht, Bert-
dc.contributor.authorSick, Beate-
dc.contributor.authorWild, Urs P.-
dc.contributor.authorDeckert, Volker-
dc.contributor.authorZenobi, Renato-
dc.contributor.authorMartin, Olivier J. F.-
dc.contributor.authorPohl, Dieter W.-
dc.date.accessioned2018-12-20T09:15:47Z-
dc.date.available2018-12-20T09:15:47Z-
dc.date.issued2000-
dc.identifier.issn0021-9606de_CH
dc.identifier.issn1520-9032de_CH
dc.identifier.issn1089-7690de_CH
dc.identifier.urihttps://digitalcollection.zhaw.ch/handle/11475/14042-
dc.description.abstractIn this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and field distributions in the vicinity of subwavelength apertures. Furthermore, the near-field optical image formation mechanism is analyzed with special emphasis on potential sources of artifacts. To underline the prospects of the technique, selected applications including amplitude and phase contrast imaging, fluorescence imaging, and Raman spectroscopy, as well as near-field optical desorption, are presented. These examples demonstrate that scanning near-field optical microscopy is no longer an exotic method but has matured into a valuable tool.de_CH
dc.language.isoende_CH
dc.publisherAmerican Institute of Physicsde_CH
dc.relation.ispartofThe Journal of Chemical Physicsde_CH
dc.rightsLicence according to publishing contractde_CH
dc.subject.ddc540: Chemiede_CH
dc.titleScanning near-field optical microscopy with aperture probes : fundamentals and applicationsde_CH
dc.typeBeitrag in wissenschaftlicher Zeitschriftde_CH
dcterms.typeTextde_CH
zhaw.departementSchool of Engineeringde_CH
zhaw.organisationalunitInstitut für Datenanalyse und Prozessdesign (IDP)de_CH
dc.identifier.doi10.1063/1.481382de_CH
zhaw.funding.euNode_CH
zhaw.issue18de_CH
zhaw.originated.zhawNode_CH
zhaw.pages.start7761de_CH
zhaw.publication.statuspublishedVersionde_CH
zhaw.volume112de_CH
zhaw.publication.reviewPeer review (Publikation)de_CH
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Hecht, B., Sick, B., Wild, U. P., Deckert, V., Zenobi, R., Martin, O. J. F., & Pohl, D. W. (2000). Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics, 112(18), 7761. https://doi.org/10.1063/1.481382
Hecht, B. et al. (2000) ‘Scanning near-field optical microscopy with aperture probes : fundamentals and applications’, The Journal of Chemical Physics, 112(18), p. 7761. Available at: https://doi.org/10.1063/1.481382.
B. Hecht et al., “Scanning near-field optical microscopy with aperture probes : fundamentals and applications,” The Journal of Chemical Physics, vol. 112, no. 18, p. 7761, 2000, doi: 10.1063/1.481382.
HECHT, Bert, Beate SICK, Urs P. WILD, Volker DECKERT, Renato ZENOBI, Olivier J. F. MARTIN und Dieter W. POHL, 2000. Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics. 2000. Bd. 112, Nr. 18, S. 7761. DOI 10.1063/1.481382
Hecht, Bert, Beate Sick, Urs P. Wild, Volker Deckert, Renato Zenobi, Olivier J. F. Martin, and Dieter W. Pohl. 2000. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics 112 (18): 7761. https://doi.org/10.1063/1.481382.
Hecht, Bert, et al. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics, vol. 112, no. 18, 2000, p. 7761, https://doi.org/10.1063/1.481382.


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