| Publikationstyp: | Beitrag in wissenschaftlicher Zeitschrift |
| Art der Begutachtung: | Peer review (Publikation) |
| Titel: | Scanning near-field optical microscopy with aperture probes : fundamentals and applications |
| Autor/-in: | Hecht, Bert Sick, Beate Wild, Urs P. Deckert, Volker Zenobi, Renato Martin, Olivier J. F. Pohl, Dieter W. |
| DOI: | 10.1063/1.481382 |
| Erschienen in: | The Journal of Chemical Physics |
| Band(Heft): | 112 |
| Heft: | 18 |
| Seite(n): | 7761 |
| Erscheinungsdatum: | 2000 |
| Verlag / Hrsg. Institution: | American Institute of Physics |
| ISSN: | 0021-9606 1520-9032 1089-7690 |
| Sprache: | Englisch |
| Fachgebiet (DDC): | 540: Chemie |
| Zusammenfassung: | In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and field distributions in the vicinity of subwavelength apertures. Furthermore, the near-field optical image formation mechanism is analyzed with special emphasis on potential sources of artifacts. To underline the prospects of the technique, selected applications including amplitude and phase contrast imaging, fluorescence imaging, and Raman spectroscopy, as well as near-field optical desorption, are presented. These examples demonstrate that scanning near-field optical microscopy is no longer an exotic method but has matured into a valuable tool. |
| URI: | https://digitalcollection.zhaw.ch/handle/11475/14042 |
| Volltext Version: | Publizierte Version |
| Lizenz (gemäss Verlagsvertrag): | Lizenz gemäss Verlagsvertrag |
| Departement: | School of Engineering |
| Organisationseinheit: | Institut für Datenanalyse und Prozessdesign (IDP) |
| Enthalten in den Sammlungen: | Publikationen School of Engineering |
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Hecht, B., Sick, B., Wild, U. P., Deckert, V., Zenobi, R., Martin, O. J. F., & Pohl, D. W. (2000). Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics, 112(18), 7761. https://doi.org/10.1063/1.481382
Hecht, B. et al. (2000) ‘Scanning near-field optical microscopy with aperture probes : fundamentals and applications’, The Journal of Chemical Physics, 112(18), p. 7761. Available at: https://doi.org/10.1063/1.481382.
B. Hecht et al., “Scanning near-field optical microscopy with aperture probes : fundamentals and applications,” The Journal of Chemical Physics, vol. 112, no. 18, p. 7761, 2000, doi: 10.1063/1.481382.
HECHT, Bert, Beate SICK, Urs P. WILD, Volker DECKERT, Renato ZENOBI, Olivier J. F. MARTIN und Dieter W. POHL, 2000. Scanning near-field optical microscopy with aperture probes : fundamentals and applications. The Journal of Chemical Physics. 2000. Bd. 112, Nr. 18, S. 7761. DOI 10.1063/1.481382
Hecht, Bert, Beate Sick, Urs P. Wild, Volker Deckert, Renato Zenobi, Olivier J. F. Martin, and Dieter W. Pohl. 2000. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics 112 (18): 7761. https://doi.org/10.1063/1.481382.
Hecht, Bert, et al. “Scanning Near-Field Optical Microscopy with Aperture Probes : Fundamentals and Applications.” The Journal of Chemical Physics, vol. 112, no. 18, 2000, p. 7761, https://doi.org/10.1063/1.481382.
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