Publikationstyp: Konferenz: Paper
Art der Begutachtung: Editorial review
Titel: Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers
Autor/-in: Dicker, Jochen
Schumacher, Jürgen
Sölter, Jens
Zimmermann, Walter
Bau, Sandra
Warta, Wilhelm
Tagungsband: Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000
Band(Heft): 2
Seite(n): 1459
Seiten bis: 1462
Angaben zur Konferenz: 16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1-5 May 2000
Erscheinungsdatum: 2000
Verlag / Hrsg. Institution: James and James
Verlag / Hrsg. Institution: London
ISBN: 1-902916-18-2
Sprache: Englisch
Schlagwörter: Sio2 barrier; Thin film; Silicon solar cells; Simulation
Fachgebiet (DDC): 621.3: Elektro-, Kommunikations-, Steuerungs- und Regelungstechnik
URI: https://www.osti.gov/etdeweb/biblio/20195361
https://digitalcollection.zhaw.ch/handle/11475/11718
Volltext Version: Publizierte Version
Lizenz (gemäss Verlagsvertrag): Lizenz gemäss Verlagsvertrag
Departement: School of Engineering
Organisationseinheit: Institute of Computational Physics (ICP)
Enthalten in den Sammlungen:Publikationen School of Engineering

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Dicker, J., Schumacher, J., Sölter, J., Zimmermann, W., Bau, S., & Warta, W. (2000). Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers [Conference paper]. Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2, 1459–1462. https://www.osti.gov/etdeweb/biblio/20195361
Dicker, J. et al. (2000) ‘Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers’, in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000. London: James and James, pp. 1459–1462. Available at: https://www.osti.gov/etdeweb/biblio/20195361.
J. Dicker, J. Schumacher, J. Sölter, W. Zimmermann, S. Bau, and W. Warta, “Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers,” in Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000, 2000, vol. 2, pp. 1459–1462. [Online]. Available: https://www.osti.gov/etdeweb/biblio/20195361
DICKER, Jochen, Jürgen SCHUMACHER, Jens SÖLTER, Walter ZIMMERMANN, Sandra BAU und Wilhelm WARTA, 2000. Numerical analysis of crystalline silicon thin film solar cells on perforated SiO2 barrier layers. In: Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the international conference held in Glasgow, United Kingdom, 1 - 5 May 2000 [online]. Conference paper. London: James and James. 2000. S. 1459–1462. ISBN 1-902916-18-2. Verfügbar unter: https://www.osti.gov/etdeweb/biblio/20195361
Dicker, Jochen, Jürgen Schumacher, Jens Sölter, Walter Zimmermann, Sandra Bau, and Wilhelm Warta. 2000. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Conference paper. In Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, 2:1459–62. London: James and James. https://www.osti.gov/etdeweb/biblio/20195361.
Dicker, Jochen, et al. “Numerical Analysis of Crystalline Silicon Thin Film Solar Cells on Perforated SiO2 Barrier Layers.” Sixteenth European Photovoltaic Solar Energy Conference 2000 : Proceedings of the International Conference Held in Glasgow, United Kingdom, 1 - 5 May 2000, vol. 2, James and James, 2000, pp. 1459–62, https://www.osti.gov/etdeweb/biblio/20195361.


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