Title: Korrelation von Licht- und Elektronenmikroskopie sowie weiteren Analysemethoden
Authors : Scherrer, Christof
Jung, Arnd
Published in : Sonderbände der Praktischen Metallographie
Volume(Issue) : 45
Pages : 207
Pages to: 212
Publisher / Ed. Institution : MAT-INFO, Werkstoff-Informationsgesellschaft
Issue Date: 2013
License (according to publishing contract) : Licence according to publishing contract
Type of review: Not specified
Language : German
Subject (DDC) : 500: Natural sciences and mathematics
Departement: School of Engineering
Organisational Unit: Institute of Materials and Process Engineering (IMPE)
Publication type: Article in scientific Journal
ISSN: 0343-3579
URI: https://digitalcollection.zhaw.ch/handle/11475/8829
Appears in Collections:Publikationen School of Engineering

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