Publication type: | Article in scientific journal |
Type of review: | Peer review (publication) |
Title: | Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes |
Authors: | Leger, J. M. Carter, S. A. Ruhstaller, Beat Nothofer, H.-G. Scherf, Ullrich Tillmann, H. Hörhold, H.-H. |
DOI: | 10.1103/PhysRevB.68.054209 |
Published in: | Physical Review B |
Volume(Issue): | 68 |
Issue: | 5 |
Issue Date: | 26-Aug-2003 |
Publisher / Ed. Institution: | American Physical Society |
ISSN: | 2469-9950 2469-9969 1098-0121 1550-235X 0556-2805 0163-1829 |
Language: | English |
Subject (DDC): | 621.3: Electrical, communications, control engineering |
Abstract: | We explore the thickness-dependent optical properties of single layer polymer light emitting diodes for two materials, poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylene-ethenylene-2,5-dioctyloxy-1,4phenylene-ethen ylene] (MEH-DOO-PPV) and poly(2,7-(9,9-bis(2-ethylhexyl))fluorene)-2,7-bis(4-methylphenyl)phenylamine (PF with 2% endcap). We compare experimental electroluminescence spectra and radiance values as a function of emissive layer thickness with simulations utilizing dipole methods within a transfer-matrix formalism. The technique is then extended to explore how simulated results depend on the assumed location of emission within the polymer layer. We show that thickness-dependent optical properties of these devices are dominated by interference effects. |
URI: | https://digitalcollection.zhaw.ch/handle/11475/6958 |
Fulltext version: | Published version |
License (according to publishing contract): | Licence according to publishing contract |
Departement: | School of Engineering |
Organisational Unit: | Institute of Computational Physics (ICP) |
Appears in collections: | Publikationen School of Engineering |
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Leger, J. M., Carter, S. A., Ruhstaller, B., Nothofer, H.-G., Scherf, U., Tillmann, H., & Hörhold, H.-H. (2003). Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes. Physical Review B, 68(5). https://doi.org/10.1103/PhysRevB.68.054209
Leger, J.M. et al. (2003) ‘Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes’, Physical Review B, 68(5). Available at: https://doi.org/10.1103/PhysRevB.68.054209.
J. M. Leger et al., “Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes,” Physical Review B, vol. 68, no. 5, Aug. 2003, doi: 10.1103/PhysRevB.68.054209.
LEGER, J. M., S. A. CARTER, Beat RUHSTALLER, H.-G. NOTHOFER, Ullrich SCHERF, H. TILLMANN und H.-H. HÖRHOLD, 2003. Thickness-dependent changes in the optical properties of PPV- and PF-based polymer light emitting diodes. Physical Review B. 26 August 2003. Bd. 68, Nr. 5. DOI 10.1103/PhysRevB.68.054209
Leger, J. M., S. A. Carter, Beat Ruhstaller, H.-G. Nothofer, Ullrich Scherf, H. Tillmann, and H.-H. Hörhold. 2003. “Thickness-Dependent Changes in the Optical Properties of PPV- and PF-Based Polymer Light Emitting Diodes.” Physical Review B 68 (5). https://doi.org/10.1103/PhysRevB.68.054209.
Leger, J. M., et al. “Thickness-Dependent Changes in the Optical Properties of PPV- and PF-Based Polymer Light Emitting Diodes.” Physical Review B, vol. 68, no. 5, Aug. 2003, https://doi.org/10.1103/PhysRevB.68.054209.
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