| Issue Date | Title | Involved Person(s) |
| 2018 | Quantitative analysis of charge transport in intrinsic and doped organic semiconductors combining steady-state and frequency-domain data | Jenatsch, Sandra; Altazin, Stéphane; Will, Paul Anton; Neukom, Martin T.; Knapp, Evelyne; Züfle, Simon; Lenk, Simone; Reineke, Sebastian; Ruhstaller, Beat |
| Aug-2019 | Simulation of a microfluidic system of droplets | Schneider, Johannes Josef; Weyland, Mathias; Flumini, Dandolo; Füchslin, Rudolf Marcel |
| 2016 | Symmetrically biased T/R switches for NMR and MRI with microsecond dead time | Brunner, David O.; Furrer, Lukas; Weiger, Markus; Baumberger, Werner; Schmid, Thomas; Reber, Jonas; Dietrich, Benjamin E.; Wilm, Bertram J.; Froidevaux, Romain; Pruessmann, Klaas P. |
| 2001 | Adsorption-energy distribution of heterogeneous surfaces predicted by projections onto convex sets | Hocker, Thomas; Aranovich, Grigoriy L.; Donohue, Marc D. |
| Dec-2018 | Procedure for experimental data assessment for numerical solver validation in the context of model based prediction of powder coating patterns | Siyahhan, Bercan; Boldrini, Marlon; Hauri, Samuel; Reinke, Nils; Boiger, Gernot Kurt |
| 2005 | Ordering phenomena in cuprates | Hackl, Rudi; Tassini, Leonardo; Venturini, Francesca; Hartinger, Christine; Erb, Andreas; Kikugawa, Naoki; Fujita, Toshitsu |
| Dec-2002 | Quantum interference phenomena between impurity states in d-wave superconductors | Michelucci, Umberto; Venturini, Francesca; Kampf, Arno |
| 2004 | Density-driven instabilities of variable-viscosity miscible fluids in a capillary tube | Meiburg, Eckart; Vanaparthy, Surya H.; Payr, Matthias D.; Wilhelm, Dirk |
| 2012 | Feuchte Lacke auf Kunststoff messen | Bariska, Andor; Reinke, Nils |
| 2011 | Pair breaking versus symmetry breaking : origin of the Raman modes in superconducting cuprates | Munnikes, N.; Muschler, B.; Venturini, Francesca; Tassini, L.; Prestel, W.; Ono, Shimpei; Ando, Yoichi; Peets, D. C.; Hardy, W. N.; Liang, Ruixing; Bonn, D. A.; Damascelli, A.; Eisaki, H.; Greven, M.; Erb, A.; Hackl, R. |
